DOI QR코드

DOI QR Code

A Defect Diagnosis of Polymer Specimen using Shearography

스펙클패턴 전단간섭법을 이용한 폴리머 시료의 결함진단

  • 김수길 (호서대학교 전기정보통신공학부) ;
  • 이준호 (호서대학교 전기공학과)
  • Published : 2006.09.30

Abstract

We present the method to calculate the phase at each point of the speckle pattern in shearographic system using Polarization components. And, to demonstrate the feasibility of the proposed system, we present the experimental results using polymer specimen.

본 논문에서는 편광소자를 이용하는 스펙클패턴 전단간섭법(shearography)에서 스펙클패턴의 각 지점에서의 위상을 얻을 수 있는 방법을 설명하고, 폴리머 시료에 대한 결함 진단 실험을 통하여 제안된 방법의 적용가능성을 입증하였다.

Keywords

References

  1. J.A. Leendertz and J.N. Butters, 'An image-shearing speckle-pattern interferometer for measuring bending moments,' J. Phys. E. vol. 6, pp. 1107-1110, 1973 https://doi.org/10.1088/0022-3735/6/11/019
  2. Y.Y. Hung, 'Shearography, a new optical method for strain measurement and nondestructive testing,' Opt. Eng. vol. 21, no.3, pp. 391-395, 1982
  3. W. Steinchen, 'Quality control of fiber-reinforced composites by means the shearographic and holographic method,' Proc. SPIE vol. 1756, 1992
  4. S.L. Tol, F.S. Chau, V.P.W. Shim, C.J. Tay, and H.M. Shang, 'Application of shearography in nondestructive testing of composite plates,' J. Mater. Process. Technol. vol. 23, pp. 267-275, 1990 https://doi.org/10.1016/0924-0136(90)90245-P
  5. W. Steinchen, L.X. Yang, M. Schuth, G. Kupfer, 'Application of shearography to quality assurace,' J. Mater. Process. Technol. vol. 52, no.1, pp. 141-150, 1992 https://doi.org/10.1016/0924-0136(94)01435-4
  6. F.S. Chau and T.W. Ng, 'A real-time digital shearing speckle interferometer,' Measure. Sci. Technol., vol. 3, pp. 381-383, 1992 https://doi.org/10.1088/0957-0233/3/4/008
  7. Y. Y. Hung, 'A phase shift technique for automation of phase determination in digital shearography,' Proc. 1994 SEM spring Conf., Baltimore, MD, 6-7 June 1994, pp. 233-240
  8. W. Steinchen and L. Yang, Digital shearography, SPIE Press, 2003
  9. Y.Y. Hung, 'Shearography fo non-destructive evaluation of composite structures,' Optics and Lasers in Engineering vol. 24, pp. 161-182, 1996 https://doi.org/10.1016/0143-8166(95)00020-8
  10. S. Dilhaire, S. Jorez, A. Cornet, L.D. Patino Lopez, W. Claeys, Measurement of the thermomechnical strain of electronic devices by shearography,' Microelectronics Reliability vol. 40, pp. 1509-1514, 2000 https://doi.org/10.1016/S0026-2714(00)00124-4
  11. S.-G. Kim, 'Phase Error Analysis in Shearography using Wave Plates,' J. of KIIEIE vol. 19, no.1, pp. 34-39, 2005 https://doi.org/10.5207/JIEIE.2005.19.1.034
  12. A. Yariv and P. Yeh, Optical Waves in Crystals(Wiley, New York, 1984), Chap. 5