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http://dx.doi.org/10.5207/JIEIE.2006.20.8.001

A Defect Diagnosis of Polymer Specimen using Shearography  

Kim, Soo-Gil (호서대학교 전기정보통신공학부)
Lee, Jun-Ho (호서대학교 전기공학과)
Publication Information
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers / v.20, no.8, 2006 , pp. 1-5 More about this Journal
Abstract
We present the method to calculate the phase at each point of the speckle pattern in shearographic system using Polarization components. And, to demonstrate the feasibility of the proposed system, we present the experimental results using polymer specimen.
Keywords
Shearography; Wollaston prism; Phase-shifting technique; Polymer specimen;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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