References
- M. Je, I. Kwon, H. Shin, and K. Lee, 'MOSFET modeling and parameter extraction for RF-ICs,' in CMOS RF Modeling, Chanracterization and Applications. Singapore: World Scientific, pp. 67-120, 2002
- E. Morifuji, H. S. Momose, T. Ohguro, T. Yoshitomi, and H. Kimijima, 'Future perspective and scaling down roadmap for RF CMOS,' Symp VLSI Technology, pp. 163-164, 1999 https://doi.org/10.1109/VLSIC.1999.797271
- A. Van Der Ziel, Noise in Solid State Devices and Circuits, New York: Wiley, 1986
- M. Miura-Mattausch, H. J. Mattausch, T. Ohguro, T. Iizuka, M. Taguchi, S. Kumashiro, and S. Miyamoto, 'MOSFET Model HiSIM Based on Surface-Potential Description for Enabling Accurate RF-CMOS Design,' Journal of Semiconductor Tech. and Science(JSTS), vol. 4, pp.133-140, Sep. 2004
- K. Han, H. Shin, and K. Lee, 'Analytical Drain Thermal Noise Current Model Valid for Deep Submicron MOSFETs,' IEEE Trans. Electron Devices, vol. 51, pp. 261-269, Feb. 2004 https://doi.org/10.1109/TED.2003.821708
- K. Han, J. Gil, S. Song, J. Han, and H. Shin, 'Complete High frequency Thermal Noise Modeling of Short-Channel MOSFETs and Design of 5.2-GHz Low Noise Amplifier,' IEEE J. Solid-State Circuits, vol. 40, no. 3, pp. 726-735, Mar. 2005 https://doi.org/10.1109/JSSC.2005.843637
- S. Asgaran, M. J. Deen, and C. H. Chen, 'Analytical Modeling of MOSFETs Channel Noise and Noise Parameters,' IEEE Trans. Electron Devices, vol. 51, pp. 2109-2114, Dec. 2004 https://doi.org/10.1109/TED.2004.838450
- J. Jeon, S. Kim, I. Kang, K. Han, K. Lee, and H. Shin, 'Analytical Thermal Noise Modeling Suitable for Circuit Design Using Short-Channel MOSFETs', IEEE Radio Frequency Integrated Circuits(RFIC2005) Symposium, pp. 637-640, June 2005 https://doi.org/10.1109/RFIC.2005.1489894