Analysis of resistor matching and poly-Si TFT characteristics for the implementation of System-on-Glass using the existing analog circuits

System-on-Glass를 구현하기 위한 저항 matching 및 poly-Si TFT특성을 기존 아날로그 회로를 이용하여 분석

  • 김대준 (한양대학교 전자통신전파공학과) ;
  • 이균렬 (한양대학교 전자통신전파공학과) ;
  • 유창식 (한양대학교 전자전기컴퓨터공학부)
  • Published : 2005.02.01

Abstract

Using the existing analog circuits, required resistor matching and Poly-Si TFT characteristics are investigated for the implementation of analog circuits to be integrated on System-on-Glass. Matching requirements on resistor values, threshold voltage and mobility of poly-Si TFT are derived as a function of the resolution of display system. Also, the effective mobility of poly-Si TFT required for the realization of source driver is analyzed for various panel sizes.

System-on-Glass 아날로그 회로를 구현하기 위해 요구되는 저항 matching 및 poly-Si TFT 특성을 기존 아날로그 회로를 이용하여 조사하였다. 저항 값, poly-Si TFT의 문턱전압 및 이동도의 matching 조건을 디스플레이 시스템의 해상도에 따라 유도하였다. 또한, 소스 드라이버를 구현하기 위해 요구되는 poly-Si TFT의 유효 이동도를 다양한 패널 크기에 따라서 분석하였다.

Keywords

References

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