Applied Microscopy

  • 제35권4호
  • /
  • Pages.64-73
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  • 2005
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  • 2287-5123(pISSN)
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  • 2287-4445(eISSN)
한국현미경학회 (Korean Society of Microscopy)
권호 표지

결정체내의 전위 결함 형태를 결정하는 LACBED 방법에 관한 고찰

On the LACBED Method to Determine the Nature of the Dislocation Defect in Crystalline Materials

  • 김황수 (경성대학교 이과대학 물리학과)
  • 발행 : 2005.12.01
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⟨ 이전 논문 다음 논문 ⟩

초록

이 논문에서 한 결정체의 전위 결함에 형태를 결정짓는 인자들 (Burgers-벡터, Slip plane, 전위선 벡터)을, LACBED 방법과 전통적인 회절 빔 상 관찰에 의해, 어떻게 얻을 수 있는가에 대해 세세히 논의하였다. 이 방법은 기본적으로 Cherns과 Prestons의 규칙과 동역학적 회절이론에 입각한 공식에 의거한 LACBED 패턴 시뮬레이션이 따른다. 이 시뮬레이션 계산에서 필요에 따라 설정된 여러 근사들에 관해서도 역시 세세히 논의 하였다. 본 실험에 사용된 시료는 적적한 밀도로 분포된 전위 결함들을 많이 갖고 있는 순순 알루미늄이며, LACBED 실험에 적합한 것이다.

In this paper we discussed in details how to determine the nature of dislocations in a crystal such as a Burgers vector, the line vector of dislocation and the associated slip plane, using LACBED and usual imaging techniques. These techniques basically involve the application of Cherns and Prestone s rules, the simulations of LACBED patterns with a certain form of the dynamical diffraction theory. The theoretical aspects including necessary approximations for calculations also were in details discussed. As a test specimen for experiments, the foils of a pure aluminum, containing many dislocations with appropriate density for LACBED experiments, were used..

키워드

참고문헌

  1. Hirth JP, Lothe J: Theory of Dislocations. McGraw-Hill, Inc. 1968
  2. Hull D, Bacon DJ: Introduction to Dislocations. 3rd ed., Butterworth-Heinemann, 1984
  3. Cherns D, Preston AR: Convergent Beam Diffraction Studies of Interfaces, Defects and Multilayers. J. Electron Microscopy Tech. 13 : 111-122, 1989 https://doi.org/10.1002/jemt.1060130204
  4. Humphrey CJ, Maher DM, Fraser HL, Eaglesham DJ: Convergent-beam imaging-a transmission electron microscopy technique for investigating small-localized distortions in crystals. Phil. Mag. A: 58 : 787-798, 1988 https://doi.org/10.1080/01418618808209953
  5. Perez R: On the Characterization of Crystalline Defects Using CBED Techniques. Phys. Stat. sol. (a): 122 : 51-68, 1990 https://doi.org/10.1002/pssa.2211220104
  6. Cherns D, Touaitia R, Preston AR, Rossouw CJ, Houghton DC: Convergent beam electron diffraction studies of strain in Si/SiGe superlattices. Phil. Mag. A: 64 : 597-612, 1991 https://doi.org/10.1080/01418619108204862
  7. Chou CT, Preston AR, Steeds JW. Dislocation contrast in large angle convergent-beam electron diffraction patterns. Phil. Mag. A: 65 : 863-888, 1992 https://doi.org/10.1080/01418619208205595
  8. Tanaka M, Terauchi, Tsuda K: Convergent Beam Electron Diffraction III: JEOL Ltd., 156-177, 1994
  9. Kim HS, Goodman P, Schwartzman A, Tulloch P, Forwood CT: LACBED study of a ${\Sigma}3$ grain boundary in a Cu+ 6 at.% Si alloy. Ultramicroscopy77 : 83-95, 1999 https://doi.org/10.1016/S0304-3991(99)00010-8
  10. Hirsch PB, Howie A, Nicholson RB, Pashley DW, Whelan MJ: Electron Microscopy of Thin Crystals. Krierger Publ., Huntington, New york, pp.640, 1977
  11. Head AK, Humble P, Clarebrough LM, Morton AJ, Forwood CT: Computed Electron Micrographs and Defect Identification. North-Holland Publ. Co., New York, pp. 71-2, 1973
  12. Kim HS: Asymmetry in Bright Field Images of Stacking Faults. Phys. Stat. Sol. (a): 90 : 231-240, 1985 https://doi.org/10.1002/pssa.2210900123
  13. Wu F, Armigliato A, Balboni R, Frabborni S: Dynamical simulation of LACBED patterns in cross-sectioned heterostructures. Micron: 31 : 211-216, 2000 https://doi.org/10.1016/S0968-4328(99)00085-2
  14. Kim HS: A New Formation of the diffraction Contrast Theory of Dislocations and its Application to the Weak Beam Images. Microsc. Microanal. 8: (Suppl. 2), 1416CD, 2002
  15. Kim HS, Kim JP: A Simple Method to Determination the Rotation Angle Between an Image and its Diffraction Pattern with LACBED Patterns. K. J. Electro. Micros. : 33 (3) : 187-193, 2003