References
- D. A. Anderson, W. E. Spear, Philos. Mag., 35 (1976) 1 https://doi.org/10.1080/14786437708235967
- P. A. Ivanov, V. E. Chelo, Semicond. Sci. Technol., 7 (1992) 863 https://doi.org/10.1088/0268-1242/7/7/001
- S. Nahano, Y. Kishi, M. Ohnishi, S. Tsuda, Shibuya H., N. NaKamura, Y. Hishikawa, H. Tami, T. Takahawa, Y. Kuwano, Mat. Res. Soc. Symp. Proc., 49 (1992) 4757
- Y. Hamakawa, Y. Matsumoto, G. HIrata, Mat. Res. Soc. Symp. Proc., 164 (1989) 291
- A. M. Haghri-Gosnet, J. Vac. Sci. Technol., 4 (1990) 1565
- T. TeraShige, K. Okano, IEEE Trans. Electron Dev., 46 (1999) 642
- J. W. Yang, D. H. Rho, J. K. Yun, J. S. Kim, J. Kor. Inst. Surf. Eng., 36 (2003) 141
- A. Ishizaka, Y. Shiraka, J. Electrochem. Soc., 133 (1986) 666 https://doi.org/10.1149/1.2108651
- Marius D. Stanate, Appl. Surf. Science 172 (2001) 4750
- M. T. Kim, J. Lee, Thin Solid Films, 303 (1997) 173 https://doi.org/10.1016/S0040-6090(97)00137-5
- F. Yan, Y. D. Zhang, P. Chen, L. Sun, S. L. Gu, Optical Mat., 23 (2003) 113 https://doi.org/10.1016/S0925-3467(03)00070-3
- A. M. Wrobel, S. Wickramanayaka, Y. Nakanishi, Y. Fukuba, Y. Hatanaka, Chem. Mater, 7 (1995) 1403 https://doi.org/10.1021/cm00055a020
- A. M. Wrobel, S. Wickranmanayaka, K. Kitamura, Y. Nakamishi, Y. Hatanaka, Chem. Vap. Deposition, 6 (2000) 315 https://doi.org/10.1002/1521-3862(200011)6:6<315::AID-CVDE315>3.0.CO;2-7
- Y. Y. Xu, T. Muramatsu, T. Aoki, Y. Hatanaka, Mat. Res. Soc. Symp. Proc., 544 (1999) 185
- A. L. Smith, Analysis of Silicones Wiley, New York, 1974 Neuauflage, Krieger Malabar 1983
- H. Zhang, Z. Xu, Optical Mat., 20 (2002) 177 https://doi.org/10.1016/S0925-3467(02)00046-0
- Y. Avigal, M. Schieber, R. Levin, J. Cryst. Growth. 24 (1974) 188 https://doi.org/10.1016/0022-0248(74)90302-9
- N. Herin, M. Lefehvere, M. Pealat, J. Perrin, J. Phys. Lett., 31 (1992) L379
- K. Takahashi, S. Nishino, J. Saraie, J. Electrochem. Soc., 139 (1992) 3565 https://doi.org/10.1149/1.2069122
- S. Veinteemnillas, V. Madigou, R. RodriguezClenente, A. Figueras, J. Cryst. Growth, 148 (1995) 383 https://doi.org/10.1016/0022-0248(94)00645-8
- D. F. Helm, E. Mack, J. Am. Chem. Soc., 59 (1937) ,6017
- K. J. Sladek, J. Electrochem. Soc., 118 (1971) 654 https://doi.org/10.1149/1.2408134