Journal of the Korea Institute of Information and Communication Engineering (한국정보통신학회논문지)

The Korea Institute of Information and Commucation Engineering (한국정보통신학회)
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A Novel Built-In Self-Test Circuit for 5GHz Low Noise Amplifiers

5GHz 저잡음 증폭기를 위한 새로운 Built-In Self-Test 회로

  • 류지열 (애리조나주립대학교 전기공학과) ;
  • 노석호 (안동대학교 전자공학과)
  • Published : 2005.08.01
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Abstract

This paper presents a new low-cost Built-In Self-Test (BIST) circuit for 50Hz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SoC) transceiver environment. The proposed BIST circuit measures the LNA specifications such as input impedance, voltage gaih, noise figure, and input return loss all in a single SoC environment.

본 논문에서는 5GHz 저잡음 증폭기(LNA)의 성능 측정을 위한 새로운 형태의 저가 BIST(Built-In Self-Test) 회로를 제안한다 이러한 BIST 회로는 system-on-chip (SoC) 송수신 환경에 적용될 수 있도록 설계되어 있다. 본 논문에서 제안하는 BIST 회로는 입력 임피던스, 전압이득, 잡음지수, 입력반사손실(input return loss) 및 출력 신호 대 잡음전력비(signal-to-noise ratio)와 같은 저잡음 증폭기의 주요 성능 지수를 측정 할 수 있으며, 단일 칩 위에 제작되어 있다.

Keywords

References

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