한국신뢰성학회지:신뢰성응용연구 (Journal of Applied Reliability)

  • 제5권2호
  • /
  • Pages.221-239
  • /
  • 2005
  • /
  • 1738-9895(pISSN)
  • /
  • 2733-8320(eISSN)
한국신뢰성학회 (The Korean Reliability Society)
권호 표지

Varistor의 ALT(Accelerated Life Testing) 설계 및 주 고장모드 분석

A Study for Accelerated Life Testing and Failure Analysis of Chip Varistor

  • 장우성 (광운대학교 전자통신과 통신망연구실) ;
  • 이준혁 (광운대학교 전자통신과 통신망연구실) ;
  • 이관훈 (전자부품연구원 신뢰성평가센터) ;
  • 오영환 (광운대학교 전자통신과 통신망연구실)
  • Chang Woo-Sung (Dept. of Industrial Engineering, Kyung Hee University) ;
  • Lee Jun-Hyuk (Dept. of Industrial Engineering, Kyung Hee University) ;
  • Lee Kwan-Hun (Reliability & Failure Analysis Center, KETI) ;
  • Oh Young-Hwan (Dept. of Industrial Engineering, Kyung Hee University)
  • 발행 : 2005.06.01
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초록

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

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