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A micromachined cantilever for chemically sensitive scanning force microscope applications

화학적 성분 분석능력을 가진 원자 현미경의 제작

  • Lee, Dong-Weon (Dept. Mechanical Systems Engineering, Chonnam National University)
  • 이동원 (전남대학교 기계시스템공학부)
  • Published : 2005.01.30

Abstract

This paper describes a novel concept of a chemically sensitive scanning force microscope (CS-SFM). It consists of the conventional SFM and the time-of-flight mass spectrometer (TOF-MS). A switchable cantilever (SC) fabricated by the micromachining technology combines each advantage of two completely different systems, SFM and TOF-MS. The CS-SFM offers to produce both images of topography and chemical information simultaneously. First we employed a rotatable tip holder based on 4 piezotube actuators for demonstration of the possibility of the CS-SFM concept. Second the CS-SFM concept is optimized with the micromachining technology. The micromachined SC with an integrated bimorph actuator and a piezoresistive strain sensor provides a reasonable switching speed of ${\sim}10$ ms which is very attractive for the CS-SFM application. The SC is currently being integrated in an ultra-high-vacuum system to perform various experiments.

Keywords

References

  1. G. Binning, H. Rohrer, C. Gerber, and E. Weibel, '7 ${\times}$ 7 reconstruction on Si (111) resolved in real space', Phys. Rev. Lett., 50, pp. 120-123, 1983 https://doi.org/10.1103/PhysRevLett.50.120
  2. G. Binning, C. F. Quale, and C. Gerber, 'Atomic force microscopy', Phys. Rev. Lett., 56, pp. 930-933, 1986 https://doi.org/10.1103/PhysRevLett.56.930
  3. D. M. Eigler and E. K. Schweizer, 'Positioning single atoms with a scanning tunnelling microscope', Nature, 344, pp. 524-526, 1990 https://doi.org/10.1038/344524a0
  4. M. F. Crommie, C. P. Lutz, and D. M, Eigler, 'Confinement of electrons to quantum corrals on a metal surface', Science, 262, pp. 218-220, 1993 https://doi.org/10.1126/science.262.5131.218
  5. M. F Crommie, C. P. Lutz, D. M. Eiger, and E. J. Heller, 'Waves on a metal surface and quantum corrals', Surf. Rev. Lett., 2, pp. 127-137, 1995 https://doi.org/10.1142/S0218625X95000121
  6. R. Wiesendanger, 'Scanning probe microscopy and spectroscopy', Cambridge Press, Cambridge, 1994
  7. H. Tanaka and T. Kawai, 'STM observation of cop-per-phthalocyanine and nucleic acid base molecules on reduced $SrTiO_3$ (100) and Cu(lll) surfaces', Jpn. J. Appl. Phys., Part 1 35, pp. 3759-3763, 1996 https://doi.org/10.1143/JJAP.35.3759
  8. J. K. Spong, H. A. Mizes, L. J. LaComb,Jr., M. M. Dovek, J. E. Frommer, and J.S. Foster, 'Contrast mechanism for resolving organic molecules with tunneling microscopy', Nature, 338, pp. 137-139, 1989 https://doi.org/10.1038/338137a0
  9. http://www.almaden.ibm.com/vis/stm/gallery.html
  10. O. Nishikawa and M. Kimoto, 'Toward a scanning atom probe - computer simulation of electric field -'. Appl. Surf. Sci., 76/77, pp. 424-430, 1994 https://doi.org/10.1016/0169-4332(94)90376-X
  11. J. C. H. Spence, U. Weierstall, and W. Lo, 'Atomic species identification in scanning tunneling microscopy by time-of-flight spectroscopy', J. Vac. Sci. Technol, B 14, pp. 1587-1590, 1996
  12. D. W. Lee, M. Despont, U. Drechsler, C. Gerber, P. Vettiger, A. Wetzel, R. Bennewitz, and E. Meyer, 'Switchable cantilever fabrication for a novel tinie-of-flight scanning force microscope', Microelectmn, 67-68, pp. 635, 2003

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