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Electrical and Optical Properties of ITO Films Sputtered by RF -bias Voltage and In-Sn Alloy Target

  • Kim, Hyun-Hoo (Digital Electronic Department, Doowon Technical College) ;
  • Shin, Sung-Ho (Energy and Resources Standards Division, Agency for Technology and Standards)
  • Published : 2004.08.01

Abstract

ITO thin films were deposited on PET and soda-lime glass substrates by a dc reactive magnetron sputtering of In-Sn alloy metal target without substrate heater and post-deposition thermal treatment. The dependency of rf-bias voltage and substrate power during deposition processing was investigated to control the electrical and optical properties of ITO films. The range of rf bias voltage is from 0 to -80 V and the substrate power is applied from 10 to 50 W. The minimum resistivity of ITO film is 5.4${\times}$10$^{-4}$ $\Omega$cm at 50 W power and rf-bias voltage of -20 V. The best transmittance of ITO films at 550 nm wavelength is 91 % in the substrate power of 30 W and rf-bias voltage of -80 V.

Keywords

References

  1. B. Chiou and S. Hsieh, 'RF magnetron sputtered indium-tin-oxide film on reactive ion etched acrylic substrate', Thin Solid Films, Vol. 229, p. 146, 1993 https://doi.org/10.1016/0040-6090(93)90357-U
  2. T. Minami, H. Sonohara, T. Kakumu, and S. Takata, 'Physics of very thin ITO conducting films with high transparency prepared by de magnetron sputteing', Thin Solid Films, Vol. 270, p. 37, 1995 https://doi.org/10.1016/0040-6090(95)06889-9
  3. M. Bender, J. Trube, and J. Stollenwerk, 'Depo-sition of transparent and conducting indium-tin-oxide films by the rf-superimposed de sputtering technology', Thin Solid Films, Vol. 354, p. 100, 1999 https://doi.org/10.1016/S0040-6090(99)00558-1
  4. J. Ma, D. Zhang, J. Zhao, C. Tan, T. Yang, and H. Ma, 'Preparation and characterization of ITO films deposited on polyimide by reactive evaporation at low temperature', Applied Surface Science, Vol.151, p. 239, 1999 https://doi.org/10.1016/S0169-4332(99)00279-2
  5. T. Futagami, Y. Shigesato, and I. Yasui, 'Characterization of rf-enhanced dc sputtering to deposit tindpoed indium oxide thin films', Jpn. J. Appl. Phys., Vol. 37, p. 6210,1998 https://doi.org/10.1143/JJAP.37.6210
  6. S. Honda, K. Chibara, M. Watamori, and K. Oura, 'Depth profiling of oxygen content of indium tin oxide fabricated by bias sputtering", Applied Surface Science, Vol. 113, p. 408, 1997 https://doi.org/10.1016/S0169-4332(96)00939-7
  7. H. Kim and S. Shin, 'Rf bias effect of ITO films reactively sputtered on PET substrates at room temperature', Trans. EEM, to be published
  8. E. Kubota, Y. Shigesato, M. Igarashi, T. Haranou, and K. Suzuki, 'Effects of magnetic field gradient on crystallographic properties in tin-doped indium oxide films deposited by electron cyclotron resonance plasma sputtering', Jpn. J. Appl. Phys., Vol. 33, p. 4997, 1994 https://doi.org/10.1143/JJAP.33.4997
  9. R. Tahar, T. Ban, Y. Ohya, and Y. Takahashi, 'Tin doped oxide thin films: electrical properties', J. Appl. Phys., Vol. 83, No.5, p. 2631, 1998 https://doi.org/10.1063/1.367025
  10. E. Terzini, G. Nobile, S. Loreti, C. Minarina, T. Polichetti, and P. Thilakan, 'Influences of sputtered power and rf magnetron sputtered indium tin oxide thin films', Jpn. J. Appl. Phys., Vol. 38, p. 3448,1999 https://doi.org/10.1143/JJAP.38.3448
  11. H. Kim, J. Sin, J. Baek, S. Shin, and K. Park, 'Effects of heat treatment methods in indium-tinoxide films by de magnetron sputter of powder target', Trans. EEM, Vol. 2, No.1, p. 22, 2001

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  1. Comparative study of ITO and TiN fabricated by low-temperature RF biased sputtering vol.34, pp.2, 2016, https://doi.org/10.1116/1.4936257