Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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An Efficient Diagnosis Algorithm for SRAM-Based FPGA Interconnects

SRAM 기반의 FPGA 연결선을 위한 고장 진단 알고리듬 개발

  • 김용준 (연세대학교 전기전자공학과) ;
  • 김지혜 (삼성전자 반도체총괄 시스템 LSI 사업) ;
  • 전성훈 (연세대학교 전기전자공학) ;
  • 강성호 (연세대학교 전기전자공학과)
  • Published : 2004.04.01
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Abstract

A new diagnosis method for FPGA interconnects is developed. The proposed method diagnoses all the fault types for FPGA interconnects. It is also applied to all the modem FPGA devices like Xilinx Virtex FPGAS. Most of all, it takes shorter time to diagnose all the faults than previous diagnosis methods.

본 논문에서는 FPGA 연결선을 위한 고장 진단 방안을 제안한다. 제안된 고장 진단 방안은 FPGA의 연결선에 존재하는 모든 고장을 진단한다. 또한 이는 최신의 FPGA 장치인 Xilinx Virtex FPGA에 적용이 가능하다. 제안된 고장 진단 방안은 기존의 고장 진단 방안에 비하여 훨씬 짧은 시간동안 고장 진단을 수행한다.

Keywords

References

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