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An Efficient Diagnosis Algorithm for SRAM-Based FPGA Interconnects  

김용준 (연세대학교 전기전자공학과)
김지혜 (삼성전자 반도체총괄 시스템 LSI 사업)
전성훈 (연세대학교 전기전자공학)
강성호 (연세대학교 전기전자공학과)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.4, 2004 , pp. 113-122 More about this Journal
Abstract
A new diagnosis method for FPGA interconnects is developed. The proposed method diagnoses all the fault types for FPGA interconnects. It is also applied to all the modem FPGA devices like Xilinx Virtex FPGAS. Most of all, it takes shorter time to diagnose all the faults than previous diagnosis methods.
Keywords
FPGA 테스트;연결선 테스트;고장진단;
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