References
- Cho, S. M., Cho, S. Y. and Han, B., 2002, 'Observing Real-time Thermal Deformations in Electronic Packaging,' Experimental Techniques, Vol. 26, No. 3, pp. 25-29 https://doi.org/10.1111/j.1747-1567.2002.tb00065.x
- Corbin, J. S, 1993, 'Finite Element Analysis for Solder Ball Connect (SBC) Structural design Optimization,' IBM J. Research Development, Vol. 37, No. 5, pp. 585-596 https://doi.org/10.1147/rd.375.0585
- Darveaux, R. and Mawer, A, 1995, 'Thermal and Power Cycle Limit of Plastic ball grid array (PBGA) assemblies,' Proc. Surface Mount Int. Conf., San Jose, CA, pp. 315-326
- Guo, Y., Post, D. and Han, B., 1992, 'Thick Composites in Compression : An Experimental Study of Micro-mechanical Behavior and Smeared Engineering Properties,' J. Composite Material, Vol. 26, No. 13, pp. 1930-1944
- Guo, Y., Lim, C. K., Chen, W. T. and Woychik, C. G., 1993, 'Solder Ball Connect (SBC) Assemblies Under Thermal Loading : I. Deformation Measurement via Moire Interferometry, and Its Interpretation,' IBM J. Research Development, Vol. 37, No. 5, pp. 635-648 https://doi.org/10.1147/rd.375.0635
- Han, B. and Guo, Y., 1995, 'Thermal Deformation Analysis of Various Electronics Packaging Products by Moire and Microscopic Moire Interferometry,' J. Electronic Packaging, Trans. ASME, Vol. 117, pp. 185-191 https://doi.org/10.1115/1.2792090
- Han, B., 1998, 'Recent Advancements of Moire and Microscopic Moire Interferometry for Thermal Deformation Analysis of Microelectrics Devices,' Experimental Mechanics, Vol. 38, No. 4, pp. 278-288
- Joo, J. W., Chai, S. E. and Shin, D. I., 2002a, 'Deformation Analysis of Composite-Patched Concrete Using Moire Interferometry,' Transactions of the KSME, A, Vol. 26, No. 1, pp. 160-170 https://doi.org/10.3795/KSME-A.2002.26.1.160
- Joo, J. and Han, B., 2002b, 'Thermo-mechanical and Flexural Analysis of WB-PBGA Package Using Moire Interferometry,' Transactions of the KSME, A, Vol. 26, No. 7, pp. 1302-1308 https://doi.org/10.3795/KSME-A.2002.26.7.1302
- Jung, W., Lau, J. H. and Pao, Y. H., 1996, 'Nonlinear Analysis of Full-matrix and Perimeter Plastic Ball Grid Array Solder Joints,' Proc. 1996 ASME International Mechanical Engineering congress & Exhibition, Atlanta, GA, pp. 1-19
- Lee, T., Lee, J. and Jung, I., 1998, 'Finite Element Analysis for Solder Ball Failures in Chip Scale Packages,' Microelectronics and Reliability, Vol. 38, No. 12, pp. 1941-1947 https://doi.org/10.1016/S0026-2714(98)00163-2
- Post, D., Han, B. and Ifju, P., 1994, High Sensitivity Moire : Experiental Analysis for Mechanics and Materials, Springer-Verlag, New York
- Zhao, J. -H., Dai, X. and Ho, P. S., 1998, 'Analysis and Modeling Verification for Thermal-mechanical Deformation in Flip-Chip Packages,' Proc. 48th Electronic Components and Technology Conference, Seattle, WA, May, 1998, pp. 336-344 https://doi.org/10.1109/ECTC.1998.678716