Dry Etching of Ru Electrodes using O2/Cl2 Inductively Coupled Plasmas

  • Kim, Hyoun Woo (School of Materials Science and Engineering, Inha University)
  • Published : 2003.10.01

Abstract

The characteristics of Ru etching using $O_2/Cl_2$ plasmas were investigated by employing inductively coupled plasma (ICP) etcher. The changes of Ru etch rate, Ru to $SiO_2$ etch selectivity and Ru electrode etching slope with the gas flow ratio, bias power, total gas flow rate, and source power were scrutinized. A high etching slope (${\sim}86^{\circ}$) and a smooth surface after etching was attained using $O_2/Cl_2$ inductively coupled plasma.

Keywords

Acknowledgement

Supported by : Samsung Electronics

References

  1. H. W. Kim, B. S. Ju, B. Y. Nam, W. J. Yoo, C. J. Kang, T. H. Ahn, J. T. Moon and M. Y. Lee, J. Vac. Sci. Technol. A 17, 2151 (1999)
  2. T. Aoyama, S. Yamazaki and K. Imai, J. Eleclrochem. Soc. 145, 2961 (1998)
  3. W. J. Yoo, J. H, Hahm, H. W. Kim, C. O. Jung, Y. B. Koh and M. Y. Lee, Jpn. .J. Appl. Phys. 35, 2501(1995)
  4. K. Nishikama, Y. Kusumi, T. Oomori, M. Hanazaki and K. Namba, Jpn. J. Appl. Phys. 32, 6102 (1993)
  5. S. Yokoyama, Y. Ito, K. Ishihara, K. Hamada, S. Ohnishi, J. Kudo and K. Sakiyama, Jpn. J. Appl. phys. 34, 767(1995)
  6. H. W. Kim, B. S. Ju, C. J. Kang, J. T. Moon, Microelectronic Engineering, to be published
  7. S. Saito and K. Kuramasu, Jpn. .J. Appl. Phys. 31, 135 (1992)
  8. W. Pan and S. B. Desu,. J. Vac. Sci. Technol. B 12, 3208 (1994)