KIEE International Transaction on Systems and Control
- Volume 2D Issue 2
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- Pages.120-124
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- 2002
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- 1598-3595(pISSN)
Diagnosis of Plasma Equipment using Neural Network and Impedance Match Monitoring
Abstract
A new methodology is presented to diagnose faults in equipment plasma. This is accomplished by using neural networks as a pattern recognizer of radio frequency (rf) impedance match data. Using a match monitor system, the match data were collected. The monitor system consisted mainly of a multifunction board and a signal flow diagram coded by Visual Designer. Plasma anomaly was effectively represented by electrical match positions. Twenty sets of fault-symptom patterns were experimentally simulated with variations in process factors, which include rf source power, pressure, Ar, and
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