References
- IEEE Transactions on Reliability v.40 Optimal Accelerated Life-Time Plans that Minimize the Maximum Test-Stress Barton,R.R.
- Journal of American Statistical Association v.54 A Basis for the Selection of a Response Surface Designs Box,G.E.P.;Draper,N.R.
- Technometrics v.1 Optimum Accelerated Life Designs for Estimation Chernoff,H.
- Journal of American Statistical Association v.81 Response Surface Designs in Flexible Regions Draper,N.R.;Guttman,I.
- IEEE Transaction v.R-24 Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions Kielpinski,T.J.;Nelson,W.
- Technometrics v.26 A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type Meeker,W.Q.Jr.
- IEEE Transactions on Reliability v.R-24 Optimum Accelerated Life Tests for Weibull and Extreme Value Distributions Meeker,W.Q.;Nelson,W.
- Technometrics v.2 An Approximation to the Negative Moments of the Positive Binomial Useful in Life Testing Mendenhall,W.;Lehman,E.H.Jr.
- IEEE Transactions on Reliability v.R-32 Optimum Simple Step-Stress Plans for Accelerated Life Testing Miller,R.;Nelson,W.
- IEEE Transactions on Reliability v.R-24 Analysis of Accelerated Life Test Data-Least Squares Methods for the Inverse Power Law Model Nelson,W.
- Technometrics v.18 Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions Nelson,W.;Kielpinski,T.J.
- Technometrics v.20 Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions Nelson,W.;Meeker,W.Q.Jr..J.