The effect of deposition condition on the oxidation of TbFeCo thin films in facing targets sputtering system

Facing targets sputtering system에서 TbFeCo박막의 산화에 미치는 제조조건의 영향

  • 문정탁 (충북대학교 공과대학 재료공학과) ;
  • 김명한 (충북대학교 공과대학 재료공학과)
  • Published : 1994.11.01

Abstract

The effect of the deposition conditions, such as the base pressure, working pressure, sputtering power, pre-sputtering, and deposition thickness in facing targets sputtering system(FTS), on the oxidation of the TbFeCo thin films was studied by investigating the magneto-optical properties as well as oxygen analysis by the AES depth profiles. The results showed that the base pressure did not affect the magnetic properties so much, probably due to the short flight distance of the sputtered particles. At the higher sputtering power and lower working pressure with pre-sputtering the oxidation of TbFeCo thin films was decreased. As the film thickness increased the TbFeCo thin films showed the perpendicular anisotropy from in-plane anisotropy overcoming the oxidation effect at the beginning of the sputtering.

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