A Via-Hole Process for GaAs MMIC's using Two-Step Dry Etching

2단계 건식식각에 의한 GaAs Via-Hole 형성 공정

  • 정문식 (산업과학기술연구소 및 포항공과대학 전자전기공학과) ;
  • 김흥락 (산업과학기술연구소) ;
  • 이지은 (산업과학기술연구소 및 포항공과대학 전자전기공학과) ;
  • 김범만 (산업과학기술연구소 및 포항공과대학 전자전기공학과) ;
  • 강봉구 (산업과학기술연구소 및 포항공과대학 전자전기공학과)
  • Published : 1993.01.01

Abstract

A via-hole process for reproducible and reliable GaAs MMIC fabrication is described. The via-hole etching process consists of two step dry etching. During the first etching step a BC $I_{3}$/C $I_{2}$/Ar gas mixure is used to achieve high etch rate and small lateral etching. In the second etching step. CC $L_{2}$ $F_{2}$ gas is used to achieve selective etching of the GaAs substrate with respect to the front side metal layer. Via holes are formed from the backside of a 100$\mu$m thick GaAs substrate that has been evaporated initially with 500.angs. thick chromium and subsequently a 2000.angs. thick gold layer. The fabricated via holes are electroplated with gold (~20$\mu$m thick) to form via connections. The results show that established via-hole process is satisfactory for GaAs MMIC fabrication.

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