Journal of the Korean Institute of Telematics and Electronics (대한전자공학회논문지)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Study on the Analysis of Bilateral Fin-Line Structure by Variational Method

변분법에 의한 Bilateral Fin-Line 구조의 해석에 관한 연구

  • Lim Jae Bong (Dept. of Elec. Eng., Kook-Min Univ.) ;
  • Lee Choong Woong ( Dept. of Elec. Eng., Seoul National Univ.)
  • 임재봉 (국민대학교 전자공학과) ;
  • 이충웅 (서울대학교 전자공학과)
  • Published : 1986.01.01
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Abstract

In this paper, the Bilateral Fin-Line structure is analyzed by Rayleigh-Ritz variational method including the effects of conductor thickness. Bilateral Fin-Line bandpass filters are realized at X-Band. Experimental results are in good agreement with the theory.

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