Proceedings of the Korean Institute of Information and Commucation Sciences Conference (한국정보통신학회:학술대회논문집)
- 2018.10a
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- Pages.381-382
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- 2018
Characteristic Analysis of 4-Types of Junctionless Nanowire Field-Effect Transistor
4가지 무접합 나노선 터널 트랜지스터의 기판 변화에 따른 특성 분석
- Oh, Jong Hyuck (Dept. of Electrical, Electronic and Control Eng., Hankyong National University) ;
- Lee, Ju Chan (Dept. of Electrical, Electronic and Control Eng., Hankyong National University) ;
- Yu, Yun Seop (Dept. of Electrical, Electronic and Control Eng., Hankyong National University)
- Published : 2018.10.18
Abstract
Subthreshold swings (SSs) and on-currents of four types of junctionless nanowire tunnel field-effect transistor(JLNW-TFET) are observed. Ge-Si structure for the source-channel junction has the highest drive current among Si-Si, Si-Ge, and Ge-Ge junction, and the drive current increases up to 1000 times compared to others. Minimum SS of Si-Si junction is reduced by up to 5 times more than others.
무접합 나노선 터널 전계 효과 트렌지스터(junctionless nanowire tunnel field-effect transistor; JLNW-TFET)에서 소스(p+), 채널(i), 드레인(n) 물질으로 실리콘 및 게르마늄을 사용하여 이 구조에 대한 문턱전압 이하 기울기(subthreshold swings; SS)와 구동전류를 관찰했다. 소스-채널을 게르마늄-실리콘일 때 실리콘-실리콘, 실리콘-게르마늄, 게르마늄-게르마늄 구조보다 구동전류가 최대 1000배 증가하였고, 실리콘-실리콘 구조가 다른 구조에 비해 최소 SS가 최대 5배 이상 감소하였다.