Mechanical and electrical responses of submicrocrystalline Cu-3%Ag alloy

초미세 결정립 Cu-3%Ag 합금의 기계적 물성과 전기 전도도

The paper deals with the mechanical and electrical responses of submicrocrystalline Cu-3%Ag alloy as a function of strain imposed by equal-channel angular pressing. When inducing the effective strain of 12, the initial grain site of ${\sim}50{\mu}m$ is evidently reduced within the range of $0.2-0.3{\mu}m$ in size, having a reasonably equiaxed shape. The results of tension tests at room temperature exhibit that the tensile strength of the present alloy increases with increasing the amount of strain whereas losing electrical conductivity slightly. This phenomenon can be explained based on fine grained structure together with the non-equilibrium state of grain boundaries.