Failure Mode Test and Analysis of Light Emitting Diodes (LEDs) for General Lighting Applications

  • Hwang, N. (Korea Photonics Technology Institute) ;
  • Lee, K.C. (Korea Photonics Technology Institute) ;
  • Park, S.H. (Korea Photonics Technology Institute) ;
  • Cho, Y.I. (Korea Photonics Technology Institute) ;
  • Yu, Y.M. (Korea Photonics Technology Institute)
  • Published : 2008.02.01