Channel Orientation Dependent Electrical Characteristics of Low Temperature Poly-Si Thin-film Transistor Using Sequential Lateral Solidification Laser Crystallization

  • Lai, Benjamin Chih-ming (Display Technology Center, Industrial Technology Research Institute) ;
  • Yeh, Yung-Hui (Display Technology Center, Industrial Technology Research Institute) ;
  • Liu, Bo-Lin (Display Technology Center, Industrial Technology Research Institute)
  • 발행 : 2007.08.27

초록

The electrical characteristics of low temperature poly-Si (LTPS) thin-film transistors (TFT) with channel parallel and perpendicular to the direction of lateral growth were studied. The poly-Si film was crystallized using sequential lateral solidification (SLS) laser crystallization technique. The channel orientation dependent turn-on characteristics were investigated by using gated-diodes and capacitance-voltage measurements

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