Derating design approach of LED for reliability improvement

LED(Light Emitting Diode)의 부하경감 설계

  • 김병남 (한양대학교 대학원 전자컴퓨터통신공학부) ;
  • 김재중 (대우일렉트로닉스 품질신뢰성연구소) ;
  • 강원창 (한양대학교 대학원 전자컴퓨터통신공학부) ;
  • 손영갑 (한양대학교 신뢰성분석연구센터(RARC)) ;
  • 장석원 (한양대학교 신뢰성분석연구센터(RARC)) ;
  • 곽계달 (한양대학교 전자전기컴퓨터공학부)
  • Published : 2007.05.30

Abstract

This paper shows a derating design approach for LED reliability improvement. The LED is widely used in display devices or circuits. The main failure of interest is defined as 100% reduction of the light output intensity of LED resulting from corrosion due to stresses, i.e. temperature and humidity. The lifetime is varied according to the stress levels under where the LED operates so that correlation of the lifetime to these stress levels over time is modeled through accelerated life testings. A derating design approach to accomplish a required reliability level of LED is proposed to determine adequate the stress levels. In the approach, $B_{10}$ life, Failure rate, Sensitivity Analysis of LED are used as a reliability metric.

Keywords