Improved algorithm for measurement area expansion of atomic force microscope using Image pyramid method

영상 피라미드법을 이용한 원자간력 현미경의 측정면적 확대 알고리즘 개선

This paper introduces an improved surface matching algorithm that can be used to reconstruct the surface topography of an object that is scanned from multiple overlapping regions by an AFM. The essence of the image matching technique is stitching two neighboring images intentionally overlapped with each other. To enhance the computational efficiency, this paper introduces a pyramid matching algorithm which makes use of reduced images for primary images. The results show that the proposed image pyramid matching algorithm is useful fer enhancing the computational efficiency.