대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2005년도 추계종합학술대회
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- Pages.861-864
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- 2005
Low Frequency Noise Characteristics of the 180nm MOSFETs
- Yoon, Young-Chang (School of Electrical Engineering, Seoul National University) ;
- Lee, Ho-Cheol (School of Electrical Engineering, Seoul National University) ;
- Kang, In-Man (School of Electrical Engineering, Seoul National University) ;
- Shin, Hyung-Cheol (School of Electrical Engineering, Seoul National University)
- 발행 : 2005.11.26
초록
Performing accurate and repeatable low frequency noise measurement is critical for modeling and simulation of flicker noise. Through the accurate and repeatable on-wafer measurement, low frequency noise characteristics of the 0.18
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