Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2001.06b
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- Pages.353-356
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- 2001
Capacitance Extraction Based on Finite Element Method Adopting Variable Dvision
가변 분할을 적용한 유한 요소법에 의한 커패시턴스 추출
Abstract
This paper proposes an efficient method for 3-dimensional capacitance extraction based on Finite Element Method(FEM). This method expands the conventional FEM by adopting variable division. This method improves the extraction efficiency 2 to 100 times and even the accuracy 1% to 3% when compared to the conventional FEM with equal division. The Proposed method can be used efficiency to extract electrical parameters of on/off-chip interconnects in VLSI systems.
Keywords