Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Capacitance Extraction Based on Finite Element Method Adopting Variable Dvision

가변 분할을 적용한 유한 요소법에 의한 커패시턴스 추출

  • 김정학 (숭실대학교 대학원 컴퓨터공학과) ;
  • 하성주 (숭실대학교 대학원 컴퓨터공학과) ;
  • 김준희 (숭실대학교 대학원 컴퓨터공학과) ;
  • 김석윤 (숭실대학교 대학원 컴퓨터공학과)
  • Published : 2001.06.01
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Abstract

This paper proposes an efficient method for 3-dimensional capacitance extraction based on Finite Element Method(FEM). This method expands the conventional FEM by adopting variable division. This method improves the extraction efficiency 2 to 100 times and even the accuracy 1% to 3% when compared to the conventional FEM with equal division. The Proposed method can be used efficiency to extract electrical parameters of on/off-chip interconnects in VLSI systems.

Keywords