Junction, Circuit and System Developments for a High-Tc Superconductor Sampler

  • Hidaka, M. (Fundamental Research Laboratories, NEC Corporation) ;
  • Satoh, T. (Fundamental Research Laboratories, NEC Corporation) ;
  • Tahara, S. (Fundamental Research Laboratories, NEC Corporation)
  • Published : 1999.08.18

Abstract

A Josephson sampler circuit using high-Tc superconductor (HTS) ramp-edge junctions has been designed, fabricated, and experimentally tested. It consists of five ramp-edge junctions with a stacked groundplane and is based on single-flux-quantum (SFQ) operations. The sampler was used to measure current waveforms at picosecond and microampere resolutions. We are developing a system based on the sampler for measuring the current waveform in a room-temperature sample. And measuring current flowing through wiring in a semiconductor large-scale integrated circuit is a promising application for the HTS sampler system.

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