Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 1999.06a
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- Pages.895-898
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- 1999
De-embedding Model including Substrate Effects
Substrate 효과를 고려한 De-embedding Model
- Hwang, Ee-Soon (Department of Semiconductor Science, Dongguk University) ;
- Lee, Dong-Ik (Department of Semiconductor Science, Dongguk University) ;
- Jung, Woong (Department of Semiconductor Science, Dongguk University)
- Published : 1999.06.01
Abstract
Recently, small signal modeling of CMOS device becomes more difficult because the design rule goes into deep submicron. De-embedding of substrate parameters is important in order to use CMOS devices at RF frequencies. In this paper, we suggest a new de-embedding model with refined physical meaning and accuracy. In GaAs IC’s, the substrate is almost an insulator but Si substrate has the semiconducting characteristics. It offers some troubles if it is treated like GaAs substrate. The conducting substrate is modeled with five resistances, which leads to very accurate modeling so long as the pad layout is symmetrical. Frequency range is up to 39㎓ and fitting accuracy is as small as 0.00037 on least square errors.
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