Analysis and optimization of Wiel-Dobke synthetic testing circuit parameters

Weil-Dobke 합성단락 시험회로의 Parameter 분석과 최적화

  • 김맹현 (한국전기 연구소 전력기기 연구부) ;
  • 류형기 (한국전기 연구소 전력기기 연구부) ;
  • 박종화 (한국전기 연구소 전력기기 연구부) ;
  • 고희석 (경남대학교 전기공학과)
  • Published : 1995.07.20

Abstract

This paper describes analysis and optimization of Weil-Dobke synthetic testing circuit parameters, which is efficient and economical test method in high capacity AC circuit breaker. In this paper, analysis of synthetic short-circuit test circuit parameter proposed nondimensional factor that is reciprocal comparison value of circuit parameter and is not related to rated of circuit breaker, in particular, this study induce minimization of required energy of critical TRV generation specified in IEC 56 standards and present optimal design of synthetic short circuit testing facilities.

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