• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.34 no.4
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• pp.383-390
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• 2016

Remote sensing data has been widely used in the estimation of crop yields by employing statistical methods such as regression model. Machine learning, which is an efficient empirical method for classification and prediction, is another approach to crop yield estimation. This paper described the corn yield estimation in Iowa State using four machine learning approaches such as SVM (Support Vector Machine), RF (Random Forest), ERT (Extremely Randomized Trees) and DL (Deep Learning). Also, comparisons of the validation statistics among them were presented. To examine the seasonal sensitivities of the corn yields, three period groups were set up: (1) MJJAS (May to September), (2) JA (July and August) and (3) OC (optimal combination of month). In overall, the DL method showed the highest accuracies in terms of the correlation coefficient for the three period groups. The accuracies were relatively favorable in the OC group, which indicates the optimal combination of month can be significant in statistical modeling of crop yields. The differences between our predictions and USDA (United States Department of Agriculture) statistics were about 6-8 %, which shows the machine learning approaches can be a viable option for crop yield modeling. In particular, the DL showed more stable results by overcoming the overfitting problem of generic machine learning methods.

• International Journal of Computer Science & Network Security
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• v.23 no.9
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• pp.17-28
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• 2023

Today Agriculture segment is a significant supporter of Indian economy as it represents 18% of India's Gross Domestic Product (GDP) and it gives work to half of the nation's work power. Farming segment are required to satisfy the expanding need of food because of increasing populace. Therefore, to cater the ever-increasing needs of people of nation yield prediction is done at prior. The farmers are also benefited from yield prediction as it will assist the farmers to predict the yield of crop prior to cultivating. There are various parameters that affect the yield of crop like rainfall, temperature, fertilizers, ph level and other atmospheric conditions. Thus, considering these factors the yield of crop is thus hard to predict and becomes a challenging task. Thus, motivated this work as in this work dataset of different states producing different crops in different seasons is prepared; which was further pre-processed and there after machine learning techniques Gradient Boosting Regressor, Random Forest Regressor, Decision Tree Regressor, Ridge Regression, Polynomial Regression, Linear Regression are applied and their results are compared using python programming.

• Advances in nano research
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• v.14 no.3
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• pp.225-234
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• 2023

In this study, we aim to use big data resources and statistical analysis to obtain a reliable instruction to reach high-quality and high yield agricultural yields. In this regard, soil type data, raining and temperature data as well as wheat production in each year are collected for a specific region. Using statistical methodology, the acquired data was cleaned to remove incomplete and defective data. Afterwards, using several classification methods in machine learning we tried to distinguish between different factors and their influence on the final crop yields. Comparing the proposed models' prediction using statistical quantities correlation factor and mean squared error between predicted values of the crop yield and actual values the efficacy of machine learning methods is discussed. The results of the analysis show high accuracy of machine learning methods in the prediction of the crop yields. Moreover, it is indicated that the random forest (RF) classification approach provides best results among other classification methods utilized in this study.

• The Journal of the Korea institute of electronic communication sciences
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• v.18 no.1
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• pp.99-106
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• 2023

Recently, many studies on crop yield prediction using deep learning technology have been conducted. These algorithms have difficulty constructing a linear map between input data sets and crop prediction results. Furthermore, implementation of these algorithms positively depends on the rate of acquired attributes. Deep reinforcement learning can overcome these limitations. This paper analyzes the performance of DQN, Double DQN and Dueling DQN to improve crop yield prediction. The DQN algorithm retains the overestimation problem. Whereas, Double DQN declines the over-estimations and leads to getting better results. The proposed models achieves these by reducing the falsehood and increasing the prediction exactness.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.16 no.5
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• pp.1414-1430
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• 2022

Due to the Internet of Things popularity, many agricultural data are collected by sensors automatically. The abundance of agricultural data makes precise prediction of rice yield possible. Because the climate factors have an essential effect on the rice yield, we considered the climate factors in the prediction model. Accordingly, this paper proposes a machine learning model for rice yield prediction in Taiwan, including the genetic algorithm and support vector regression model. The dataset of this study includes the meteorological data from the Central Weather Bureau and rice yield of Taiwan from 2003 to 2019. The experimental results show the performance of the proposed model is nearly 30% better than MARS, RF, ANN, and SVR models. The most important climate factors affecting the rice yield are the total sunshine hours, the number of rainfall days, and the temperature.The proposed model also offers three advantages: (a) the proposed model can be used in different geographical regions with high prediction accuracies; (b) the proposed model has a high explanatory ability because it could select the important climate factors which affect rice yield; (c) the proposed model is more suitable for predicting rice yield because it provides higher reliability and stability for predicting. The proposed model can assist the government in making sustainable agricultural policies.

• Journal of Korean Society for Quality Management
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• v.51 no.1
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• pp.55-65
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• 2023

Purpose: The purpose of this study is to propose an optimization process to improve product yield in the process using process data. Recently, research for low-cost and high-efficiency production in the manufacturing process using machine learning or deep learning has continued. Therefore, this study derives major variables that affect product defects in the manufacturing process using eXplainable Artificial Intelligence(XAI) method. After that, the optimal range of the variables is presented to propose a methodology for improving product yield. Methods: This study is conducted using the injection molding machine AI dataset released on the Korea AI Manufacturing Platform(KAMP) organized by KAIST. Using the XAI-based SHAP method, major variables affecting product defects are extracted from each process data. XGBoost and LightGBM were used as learning algorithms, 5-6 variables are extracted as the main process variables for the injection process. Subsequently, the optimal control range of each process variable is presented using the ICE method. Finally, the product yield improvement methodology of this study is proposed through a validation process using Test Data. Results: The results of this study are as follows. In the injection process data, it was confirmed that XGBoost had an improvement defect rate of 0.21% and LightGBM had an improvement defect rate of 0.29%, which were improved by 0.79%p and 0.71%p, respectively, compared to the existing defect rate of 1.00%. Conclusion: This study is a case study. A research methodology was proposed in the injection process, and it was confirmed that the product yield was improved through verification.

• Korean Journal of Remote Sensing
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• v.39 no.5_3
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• pp.1031-1042
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• 2023

In this study, a deep learning model was developed to predict the yield of cabbage and radish, one of the five major supply and demand management vegetables, using satellite images of Landsat 8. To predict the yield of cabbage and radish in Gangwon-do from 2015 to 2020, satellite images from June to September, the growing period of cabbage and radish, were used. Normalized difference vegetation index, enhanced vegetation index, lead area index, and land surface temperature were employed in this study as input data for the yield model. Crop yields can be effectively predicted using satellite images because satellites collect continuous spatiotemporal data on the global environment. Based on the model developed previous study, a model designed for input data was proposed in this study. Using time series satellite images, convolutional neural network, a deep learning model, was used to predict crop yield. Landsat 8 provides images every 16 days, but it is difficult to acquire images especially in summer due to the influence of weather such as clouds. As a result, yield prediction was conducted by splitting June to July into one part and August to September into two. Yield prediction was performed using a machine learning approach and reference models , and modeling performance was compared. The model's performance and early predictability were assessed using year-by-year cross-validation and early prediction. The findings of this study could be applied as basic studies to predict the yield of field crops in Korea.

• IE interfaces
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• v.23 no.3
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• pp.205-212
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• 2010

The learning curve model is a mathematical form which represents the relationship between the manufacturing experience and its effectiveness. The semiconductor manufacturing is widely known as an appropriate example for the learning effect due to its complicated manufacturing processes. In this paper, I propose a new compound learning curve model for semiconductor products in which the general learning curve model and the growth curve are composed. The dependent variable and the effective independent variables of the model were abstracted from the existing learning curve models and selected according to multiple regression processes. The simulation results using the historical DRAM data show that the proposed compound learning curve model is one of adequate models for describing learning effect of semiconductor products.

• Journal of The Korean Society of Grassland and Forage Science
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• v.41 no.4
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• pp.287-294
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• 2021

The objective of this study was conducted to calculate the damage of whole crop maize in accordance with abnormal climate using the forage yield prediction model through machine learning. The forage yield prediction model was developed through 8 machine learning by processing after collecting whole crop maize and climate data, and the experimental area was selected as Gyeonggi-do. The forage yield prediction model was developed using the DeepCrossing (R²=0.5442, RMSE=0.1769) technique of the highest accuracy among machine learning techniques. The damage was calculated as the difference between the predicted dry matter yield of normal and abnormal climate. In normal climate, the predicted dry matter yield varies depending on the region, it was found in the range of 15,003~17,517 kg/ha. In abnormal temperature, precipitation, and wind speed, the predicted dry matter yield differed according to region and abnormal climate level, and ranged from 14,947 to 17,571, 14,986 to 17,525, and 14,920 to 17,557 kg/ha, respectively. In abnormal temperature, precipitation, and wind speed, the damage was in the range of -68 to 89 kg/ha, -17 to 17 kg/ha, and -112 to 121 kg/ha, respectively, which could not be judged as damage. In order to accurately calculate the damage of whole crop maize need to increase the number of abnormal climate data used in the forage yield prediction model.

• IE interfaces
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• v.22 no.3
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• pp.252-262
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• 2009

It is crucial to prevent low yields in the semiconductor industry. Since many factors affect variation in yield and they are deeply related, preventing low yield is difficult. There have been substantial researches in the field of yield prediction. Many researchers had used the statistical methods. Many studies have shown that artificial neural network (ANN) achieved better performance than traditional statistical methods. However, despite ANN's superior performance some problems such as over-fitting and poor explanatory power arise. In order to overcome these limitations, a relatively new machine learning technique, support vector machine (SVM), is introduced to classify the yield. SVM is simple enough to be analyzed mathematically, and it leads to high performances in practical applications. This study presents a new efficient classification methodology, Stepwise-SVM (SSVM), for detecting high and low yields. SSVM is step-by-step adjustment of parameters to be precisely the classification for actual high and low yield lot. The objective of this paper is to examine the feasibility of SVM and SSVM in the yield classification. The experimental results show that SVM and SSVM provides a promising alternative to yield classification for the field data.