• 제어로봇시스템학회:학술대회논문집
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• 1996.10b
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• pp.210-212
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• 1996

Random drift rate (i.e., random drift in angle rate) of a gyro represents the major error source of inertial navigation systems that are required to operate over long time intervals. It is uncorrectable and leads to an increase in the error with the passage of time. In this paper a technique is presented for analyzing random process from experimental data and the results are presented. The problem of estimating the a priori statistics of a random process is considered using time averages of experimental data. Time averages are calculated and used in the optimal data-processing techniques to determine the statistics of the random process. Therefore the contribution each component to the gyro drift process can be quantitatively measured by its statistics. The above techniques will be applied to actual gyro drift rate data with satisfactory results.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.4
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• pp.24-31
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• 1995

In this paper, the dual-mode burst-error-correcting decoding algorithm is adapted to the multiple trellis-coded .pi./4 shift QPSK in order to achieve the improvement of bit error rate (BER) performance over fading channels. The dual-mode adaptive decoder which combines maximum likelihood decoding with a burst detection scheme usually operates as a Viterbi decoder and switches to time diversity error recovery whenever an uncorrectable error pattern is identified. Rayleigh fading channels and Rician fading channels having the Rician parameter K=5dB are used in computer simulation, and the simulation results are compared with those of interleaving techniques. It is shown that under the constraint of the fixed overall memory quantity, the dual-mode adaptive decoding scheme gains an advantage in the BER performance with respect to interleaving strategies.

• Journal of Advanced Navigation Technology
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• v.20 no.4
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• pp.321-328
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• 2016

Typical MLC NAND flash devices are considered less reliable than SLC NAND flash devices. Although raw bit error rate (RBER) of MLC flash had been considered approximately 1000times or more higher than that of SLC flash, recent research conducted on Google's data center shows that it is much lower than such expectation. Based on the research, we devised In Drive Data Duplication (IDDD) scheme that efficiently exploit MLC flash's sufficient capacity to improve its data reliability without structural complexity increment using SSD intrinsic firmware layer, and showed the data reliability expectation of MLC flash could be significantly higher than that of SLC flash from measured and calculated error rates. Even though RBER of SLC flash was lower than that of MLC flash in 44 out of 48 cases we studied, applying IDDD scheme, RBER of MLC flash was became lower than that of SLC in all 48 cases and uncorrectable bit error rate (UBER) of MLC flash was became lower than that of SLC flash in 45 out of 48 cases.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.26 no.4B
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• pp.427-436
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• 2001

RS product codes are widely used in digital storage systems. There are lots of decoding strategies for product code for short-length RS codes. Unfortunately many of them cannot be applied to long-length RS product codes because of the complexity of decoder. This paper proposes new decoding strategies which can be used in long length RS product codes.