• 제목/요약/키워드: technology lifetime

검색결과 930건 처리시간 0.028초

Effects of constituents in CNT pastes on the field emission characteristics of carbon nanotubes

  • Yoon, Seung-Il;Kim, Sam-Soo;Lee, Yang-Kyu;Kim, Tae-Kwon;Lee, Dong-Gu
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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    • pp.1206-1209
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    • 2006
  • Carbon nanotubes (CNTs) have been significantly used for the field emitters for display applications. However, the lifetime of CNT emitters which are formed by screen printing technique is not guaranteed yet, because the constituents in CNT paste affect the lifetime of CNTs. The CNT pastes for screen printing are normally composed of organic vehicles (nitro cellulose, ethyl cellulose, etc) and additives (glass frits, ITO, etc) with CNTs. In this study, the effects of constituents in CNT pastes on the lifetime and emission characteristics of CNTs were investigated by thermal and electrical analysis. Use of glass frits worsened the lifetime and electron emission of CNTs. However, an addition of ITO to CNT paste rather improved the lifetime of CNTs. Degradation of CNTs was small when nitro cellulose was used in CNT paste as an organic vehicle.

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Real-time Fluorescence Lifetime Imaging Microscopy Implementation by Analog Mean-Delay Method through Parallel Data Processing

  • Kim, Jayul;Ryu, Jiheun;Gweon, Daegab
    • Applied Microscopy
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    • 제46권1호
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    • pp.6-13
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    • 2016
  • Fluorescence lifetime imaging microscopy (FLIM) has been considered an effective technique to investigate chemical properties of the specimens, especially of biological samples. Despite of this advantageous trait, researchers in this field have had difficulties applying FLIM to their systems because acquiring an image using FLIM consumes too much time. Although analog mean-delay (AMD) method was introduced to enhance the imaging speed of commonly used FLIM based on time-correlated single photon counting (TCSPC), a real-time image reconstruction using AMD method has not been implemented due to its data processing obstacles. In this paper, we introduce a real-time image restoration of AMD-FLIM through fast parallel data processing by using Threading Building Blocks (TBB; Intel) and octa-core processor (i7-5960x; Intel). Frame rate of 3.8 frames per second was achieved in $1,024{\times}1,024$ resolution with over 4 million lifetime determinations per second and measurement error within 10%. This image acquisition speed is 184 times faster than that of single-channel TCSPC and 9.2 times faster than that of 8-channel TCSPC (state-of-art photon counting rate of 80 million counts per second) with the same lifetime accuracy of 10% and the same pixel resolution.

결정질 실리콘 태양전지 적용을 위한 HWCVD $SiN_x$ 막 연구 ($SiN_x$ Film Deposited by Hot Wire Chemical Vapor Deposition Method for Crystalline Silicon Solar Cells)

  • 김하영;박민경;김민영;최정호;노시철;서화일
    • 반도체디스플레이기술학회지
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    • 제13권3호
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    • pp.27-33
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    • 2014
  • To develop high efficiency crystalline solar cells, the $SiN_x$ film for surface passivation and anti-reflection coating is very important and it is generally deposited by PECVD. In this paper, the $SiN_x$ film deposited by Hot-Wire chemical vapor deposition(HWCVD) that has no plasma damage was studied. First, to optimize the $SiN_x$ film deposition process, $SiH_4$ gas rate and substrate temperature were varied and then refractive index and thickness were measured. When $SiH_4$ gas rate was 22sccm and substrate temperature was $100^{\circ}C$, refractive index was 1.94 and higher than that of other process conditions. Second, the lifetime was measured by varying the annealing temperature and time. The annealing process was made from 5 to 30 minutes at $300{\sim}500^{\circ}C$. When the annealing temperature was $100^{\circ}C$ and time was 10minute, the lifetime was the highest. The lifetime of annealed samples was also measured after the firing process at $975^{\circ}C$. Although the lifetime of all samples was decreased by firing process, the lifetime of annealed samples before the firing process was higher than that of fired samples only. Finally, the characteristics of solar cells with HWCVD $SiN_x$ film were measured.

휴대폰용 전력증폭기의 신뢰성 평가기준 (Reliability Assessment Criteria of Power Amplifier for Mobile Phone)

  • 이우성;황순미;이관훈;송병석;정해성;오근태
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제9권3호
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    • pp.233-248
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    • 2009
  • PAM(Power Amplifier Module) is the important part of a mobile phone transmitter. It amplifies the strength of signal transmitting from a mobile phone to base stations enough to resist noise or interference. In this paper reliability assessment criteria for the PAM are established in terms of quality certification test and lifetime test. The former quality certification test comprises general performance test and environmental test. Items which pass the test undergo lifetime test which guarantees the extent of mean lifetime with certain confidence.

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NUND: Non-Uniform Node Distribution in Cluster-based Wireless Sensor Networks

  • Ren, Ju;Zhang, Yaoxue;Lin, Xiaodong
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • 제8권7호
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    • pp.2302-2324
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    • 2014
  • Cluster-based wireless sensor network (WSN) can significantly reduce the energy consumption by data aggregation and has been widely used in WSN applications. However, due to the intrinsic many-to-one traffic pattern in WSN, the network lifetime is generally deteriorated by the unbalanced energy consumption in a cluster-based WSN. Therefore, energy efficiency and network lifetime improvement are two crucial and challenging issues in cluster-based WSNs. In this paper, we propose a Non-Uniform Node Distribution (NUND) scheme to improve the energy efficiency and network lifetime in cluster-based WSNs. Specifically, we first propose an analytic model to analyze the energy consumption and the network lifetime of the cluster-based WSNs. Based on the analysis results, we propose a node distribution algorithm to maximize the network lifetime with a fixed number of sensor nodes in cluster-based WSNs. Extensive simulations demonstrate that the theoretical analysis results determined by the proposed analytic model are consistent with the simulation results, and the NUND can significantly improve the energy efficiency and network lifetime.

기계식 시한 신관 KM577A1용 기폭관 저장수명 예측 (Storage lifetime estimation of detonator in Fuse MTSQ KM577A1)

  • 장일호;박병찬;황택성;홍석환;백승준;손영갑
    • 품질경영학회지
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    • 제38권4호
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    • pp.504-511
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    • 2010
  • A fuze detonator comprising star shells is an important device so that its failure usually leads to failure of the shells. In this paper, accelerated degradation tests of RD1333 (lead azide) using temperature stress were performed, and then degradation data of explosive power for the detonator were analyzed to predict the storage lifetime of detonator. Degradation data analysis to estimate the storage lifetime is based on a distribution-based degradation process. Statistical distribution parameters of explosive power degradation measures at each time were estimated for each temperature level, and then reliability of the detonator for each accelerated temperature level was estimated using both time-varying distribution parameters and critical level of explosive power. Arrhenius model was applied to estimate storage lifetime of the detonator under the field temperature condition. Accelerated distribution-based degradation analysis to estimate storage lifetime is explained in detail, and estimation results are compared to field data of storage lifetime in this paper.

미션 프로파일을 고려한 단상 5-레벨 태양광 NPC 인버터의 전력 반도체 소자 수명 분석 (Lifetime Evaluation of Power Devices of Single-Phase 5-Level NPC Inverters Considering Mission Profile of PV Systems)

  • 류태림;최의민
    • 전력전자학회논문지
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    • 제27권3호
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    • pp.221-227
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    • 2022
  • The reliability improvement of PV systems is an important factor in reducing the cost of PV energy because it is closely related to the annual energy production as well as the maintenance cost of PV systems. The reliability of PV inverters plays a key role in the reliability of PV systems because it is regarded as one of the most reliable critical parts of PV systems. The lifetime evaluation of PV inverters considering the mission profile in the design phase plays an important role in reliability design to ensure the required lifetime of PV inverters. In this paper, the lifetime of representative single-phase T-type and I-type NPC inverters are comparatively evaluated by considering the mission profile of a PV system recorded at Iza, Spain. Furthermore, the effect of the pulse width modulation methods on the lifetime is also discussed. The lifetime evaluation of PV inverters is performed at the component-level first and then the system level by considering all power devices.

Lifetime Assessment for Oil-Paper Insulation using Thermal and Electrical Multiple Degradation

  • Kim, Jeongtae;Kim, Woobin;Park, Hung-Sok;Kang, Ji-Won
    • Journal of Electrical Engineering and Technology
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    • 제12권2호
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    • pp.840-845
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    • 2017
  • In this paper, in order to investigate the lifetime of oil-paper insulation, specimens were artificially aged with thermal and electrical multiple stresses. Accelerated ageing factors and equivalent operating years for each aging temperatures were derived from results of tensile strengths for the aged paper specimens. Also, the evaluation for the multi-stress aged specimens were carried out through the measurement of impulse breakdown voltage at high temperature of $85^{\circ}C$. The lifetimes of the oil-paper insulations were calculated with the value of 66.7 for 1.0 mm thickness specimens and 69.7 for 1.25 mm thickness specimens throughout the analysis of impulse BD voltages using equivalent operating years, which means that dielectric strengths would not be severely decreased until the mechanical lifetime limit. Therefore, for the lifetime evaluation of the oil-paper insulation, thermal aging would be considered as a dominant factor whereas electrical degradation would be less effective.

Maximizing the Efficiency Lifetime Product for Phosphorescent OLEDs

  • Adamovich, Vadim;Kwong, Raymond C.;Weaver, Michael S.;Hack, Mike;Brown, Julie J.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.272-276
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    • 2004
  • Great strides in organic light emitting device (OLED) technology have resulted in a number of commercial products. To continue this growth into large area displays, for example televisions, an understanding of the mechanisms that drive the OLED device efficiency and lifetime performance is critical. In this work, we consider maximizing the efficiency lifetime product based on phosphorescent OLED ($PHOLED^{TM}$) technology. We report green PHOLEDs with luminous efficiency of 82 cd/A, 5.7 V and 10,000 hours lifetime at 1,000 cd/$m^2$,red PHOLEDs with CIE of (0.67,0.33), 11 cd/A and 35,000 hours lifetime at 500 cd/$m^2$ and recent progress in blue demonstrating efficiencies of 18 cd/A at 200 cd/$m^2$.

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Effects of Constituents in CNT Pastes on the Field Emission Characteristics of Carbon Nanotubes

  • 김석환;이동구
    • 한국전기전자재료학회논문지
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    • 제24권3호
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    • pp.245-249
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    • 2011
  • Carbon nanotubes (CNTs) have been significantly used for the field emitters for display applications. However, the lifetime of CNT emitters which are formed by screen printing technique is not guaranteed yet, because the constituents in CNT paste affect the lifetime of CNTs. The CNT pastes for screen printing are normally composed of organic vehicles (nitro cellulose, ethyl cellulose, etc) and additives (glass frits, indium tin oxide (ITO), etc) with CNTs. In this study, the effects of constituents in CNT pastes on the lifetime and emission characteristics of CNTs were investigated by thermal and electrical analysis. Use of glass frits worsened the lifetime and electron emission of CNTs. However, an addition of ITO to CNT paste rather improved the lifetime of CNTs. Degradation of CNTs was small when nitro cellulose was used in CNT paste as an organic vehicle.