• Title/Summary/Keyword: surface display

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Emission Properties of P-ELD by Thickness of Phosphor and Insulating layer (절연층 두께 변화에 따른 분산형 ELD의 발광특성)

  • 박수길;조성렬
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.520-524
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    • 1999
  • Light-emitting diode(LEDs), diode arrays, and phosphor display panels are finding increased use in a variety of commercial applications. Present and anticipated application of these devices include solid state indicator and display systems. In this work, Phosphor based on ZnS:Cu are used. Relation by luminance with the thickness of insulating layer and phosphor layer are discussed. Increased thickness of insulating layer are stable on voltage to 300V. By considering thickness and voltage, optimal structure and thickness are investigated. In order to maximize even surface emission, various sieving processes are introduced. 150cd/m$^2$ luminance by various wave intensity are investigated in stable voltage and frequency.

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Assessment of Air Flow Misalignment Effects on Fume Particle Removal in Optical Plastic Film Cutting Process

  • Kim, Kyoungjin;Park, Joong-Youn
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.4
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    • pp.51-58
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    • 2020
  • Many types of optical plastic films are essential in optoelectronics display unit fabrication and it is important to develop high precision laser cutting methods of optical films with extremely low level of film surface contamination by fume particles. This study investigates the effects of suction and blowing air motions with air flow misalignment in removing fume particles from laser cut line by employing random particle trajectory simulation and probabilistic particle generation model. The computational results show fume particle dispersion behaviors on optical film under suction and blowing air flow conditions. It is found that suction air flow motion is more advantageous to blowing air motion in reducing film surface contamination outside designated target margin from laser cut line. While air flow misalignment adversely affects particle dispersion in blowing air flows, its effects become much more complicated in suction air flows by showing different particle dispersion patterns around laser cut line. It is required to have more careful air flow alignment in fume particle removal under suction air flow conditions.

CRT Competitive Strategies Towards Flat Panel Displays

  • Sluyterman, A.A.S.
    • Journal of Information Display
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    • v.4 no.1
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    • pp.38-42
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    • 2003
  • CRTs can survive in the long run for TV applications, because of their realistic reproduction of live images. CRT technology development has to be directed towards form factor, but also attention has to be paid to the form design of sets. The CRT is the only technology allowing a doubly curved screen surface.

Nano Crystalline Change by Heat Treatment

  • Sun, Yong-Bin
    • Journal of the Semiconductor & Display Technology
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    • v.12 no.4
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    • pp.55-59
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    • 2013
  • Mold die sticking arises from silica filler abrasion to the cavity surface. Ni-P electroplating was examined to substitute conventional hard Cr plating. More than 4% of Phosphorus in the electroplated film produces nano crystal structure and annealing makes $Ni_3P$ precipitated to get hardness values equivalent to hard Cr.

Advances in Microplasma Technologies for Display Applications

  • Park, Sung-Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.333-336
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    • 2009
  • A series of microcavity plasma devices having various electrode geometries were investigated for the display and lighting applications. Addressable, self-assembled Al/$Al_2O_3$ electrodes were fabricated in a thin, flexible single sheet of Al foil. And, enhanced luminance and efficient microplasmas are achieved by precise control of the cross-sectional geometry and surface morphology of the cavities within the microplasma devices. New microdischarge system fabricated in various substrates will be introduced.

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Wall Voltage Transfer Characteristics according to Address Bias Voltage

  • Lee, Y.M.;Jeong, D.C.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.601-604
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    • 2007
  • In this paper, we report the wall voltage transfer characteristic between sustain electrodes according to the address bias voltage in a 3-electrodes surface discharge type ac PDP by the VT close curve measurement technique. The result shows the change of wall voltage according to the gap voltage variation depends on the address bias voltage.

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Effect of the Surface Roughness of ITO Thin Films on the Characteristics of OLED Device (ITO 박막의 표면 거칠기에 따른 OLED 소자의 특성)

  • Lee, Bong-Kun;Lee, Kyu-Mann
    • Journal of the Semiconductor & Display Technology
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    • v.8 no.4
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    • pp.49-52
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    • 2009
  • We have investigated the effect of the surface roughness of TCO substrate on the characteristics of OLED (organic light emitting diodes) devices. In order to control the surface roughness of ITO thin films, we have processed photolithography and reactive ion etching. The micro-size patterned mask was used, and the etching depth was controlled by changing etching time. The surface morphology of the ITO thin film was observed by FESEM and atomic force microscopy (AFM). And then, organic materials and cathode electrode were sequentially deposited on the ITO thin films. Device structure was ITO/$\alpha$-NPD/DPVB/Alq3/LiF/Al. The DPVB was used as a blue emitting material. The electrical characteristics such as current density vs. voltage and luminescence vs. voltage of OLED devices were measured by using spectrometer (minolta CS-1000A). The current vs. voltage and luminance vs. voltage characteristics were systematically degraded with increasing surface roughness. Furthermore, the retention test clearly presented that the reliability of OLED devices was directly influenced with the surface roughness, which could be interpreted in terms of the concentration of the electric field on the weak and thin organic layers caused by the poor step coverage.

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A Study on Surface Roughness in Wire Electrical Discharge Machining of STD11 based on Taguchi method (다구찌법에 의한 STD11의 와이어방전가공에서 표면거칠기에 관한 연구)

  • Choi, Man Sung
    • Journal of the Semiconductor & Display Technology
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    • v.13 no.3
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    • pp.7-11
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    • 2014
  • The experimental analysis presented aims at the selection of the most optimal machining parameter combination for wire electrical discharge machining (WEDM) of STD11. Based on the Taguchi experimental design ($L_{27}$ orthogonal array) method, a series of experiments were performed by considering time-on, voltage, time-off, wire speed, and flow rate as input parameters. The surface roughness was considered responses. Based on the signal-to-noise (S/N) ratio, the influence of the input parameters on the responses was determined. The optimal machining parameters setting for the minimum surface roughness was found using Taguchi methodology. In order to investigate the effects of process parameters on the surface machined by WEDM, Several experiments are conducted to consider effects of time-on, voltage, time-off, wire speed and flow rate on the surface roughness. Analysis of variance (ANOVA) as well as regression analysis are performed on experimental data. The best results of surface roughness were obtained at higher voltage, lower wire speed, and lower time-on.

Effect of surface roughness of AZO thin films on the characteristics of OLED device (AZO 박막의 표면 거칠기에 따른 OLED 소자의 특성)

  • Lee, B.K.;Lee, K.M.
    • Journal of the Semiconductor & Display Technology
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    • v.9 no.4
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    • pp.25-29
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    • 2010
  • We have investigated the effect of surface roughness of TCO substrate on the characteristics of OLED (organic light emitting diodes) devices. In order to control the surface roughness of AZO thin films, we have processed photo-lithography and reactive ion etching. The micro-size patterned mask was used, and the etching depth was controlled by changing etching time. The surface morphology of the AZO thin film was observed by FESEM and atomic force microscopy (AFM). And then, organic materials and cathode electrode were sequentially deposited on the AZO thin films. Device structure was AZO/${\alpha}$-NPD/DPVB/$Alq_3$/LiF/Al. The DPVB was used as a blue emitting material. The electrical characteristics such as current density vs. voltage and luminescence vs. voltage of OLED devices were measured by using spectrometer. The current vs. voltage and luminance vs. voltage characteristics were systematically degraded with increasing surface roughness. Furthermore, the retention test clearly presented that the reliability of OLED devices was directly influenced with the surface roughness, which could be interpreted in terms of the concentration of the electric field on the weak and thin organic layers caused by the poor step coverage.