• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.8
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• pp.63-71
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• 1993

To verify validity of the steady-state Nyquist theorem and the steady-state Nyquist theorem with hot carrier effects in semiconductor devices, we calculate thermal noise in n-i-n structures using both the steady-state Nyquist theorem and the Monte-Carlo method, and compare the results from these two-methods. When the carrier temperature is not far from the lattice temperature, the results from both methods agree with each other very well, but in the hot carrier regime there are some discrepancies. Our results support the argument that for MOSFETs and MESFETs operating in the linear region, the channel thermal noise should be explained by the steady-state Nyquist theorem rather than by the existing theories.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.10
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• pp.114-118
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• 1994

To resolve thd discrepancy between the existing channel thermal noise theory of MOSFETs and a new theory called the stady-state Nyquist theorem, we have measured the channel thermal noise of specially designed MOSFETs with both uniform and nonuniform channels. the experimental results clearly show that the correct theory of the channel thermal nois in MOSFETs should be the steady-state Nyquist theorem.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.3
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• pp.110-117
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• 1995

New formulas for the minimum noise figure and the optimum source impedance of microwave FETs are derived using the noise equivalent circuits obtained from the steady-state Nyquist theorem for multi-terminal semiconductor devices. The derived formulas manifest the relationships between the noise sources and the physical parameters of a noise equivalent circuit. Furthermore the formulas can explain the effect of gate leakage current on the minimum noise figure and the optimum source impedance. comparisons with the published experimental data confirm the validity and usability of our formula.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.10
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• pp.107-114
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• 1996

Monte carlo method is especially a useful method for the analysis of thermal noise of semiconductor devices since the time dependence of microscopic details is simulated directly. Recently, a mthod for the calculation of the instantaneous currents of 2-dimensional devices, which is numerically more accurate than the conventional method, has been proposed using the generalized ramo-shockley theorem. Using this mehtod we investage the validity of the existing thermal noise theories of field-effect transistors. First, the 1-dimensional analysis of thermal noise theories of field-effect transistors. First, the 1-dimensional analysis of thermal noise theories of field-effect transistors. First, the 1-dimensional analysis of thermal noise using ramo-shockley theorem is shown to be applicable to 2 dimensional devices if the frequency of interest is low enough. The correlation between electrons in different regions of th echannel is shown not to be negligible. And we also obtian the spatial map of the noise in the channel region. By doing so, we show that the steady state nyquist theorem is the correct theory rather than the theory by van der ziel et.al.