• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 B
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• pp.1243-1244
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• 2006

In this paper, PZT(20/80) thick films were fabricated by the screen-printing method. And the PZT(80/20) coating solution was synthesized by the sol-gel method. PZT(20/80) thick films were screen-printed on the alumina substrates. PZT(80/20) thin film was spin-coated on the PZT(20/80) thick films to obtain densification. And the structural and electrical properties of PZT thick films were investigated with variation of sintering temperature. The PZT specimen sintered at $650^{\circ}C$ showed good relative dielectric constant of 219 and dielectric loss of 2.45%. Also the remanent polarization and the coercive field were $16.48{\mu}C/cm^2$ and 35.48kV/cm, respectively.

• 한국반도체및디스플레이장비학회:학술대회논문집
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• 한국반도체및디스플레이장비학회 2006년도 춘계학술대회
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• pp.194-197
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• 2006

Lead-free bismuth-layered perovskite ferroelectric europium-substituted $Bi_{4}Ti_{3}O_{12}(BTO)$ thin films have been successfully deposited on Pt/Ti/$SiO_2$/Si substrate by a sol-gel spin-coating process. $Bi(TMHD)_3,\;Eu(THMD)_3,\;Ti(OiPr)_4$ were used as the precursors, which were dissolved in 2-methoxyethanol. The thin films were annealed at various temperatures from $600^{\circ}\;to\;720^{\circ}C$ in oxygen ambient for 1 hr, which was followed by post-annealed for 1 hr after depositing a Pt electrode to enhance the electrical properties. X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to analyze the crystallinity and surface morphology of layered perovskite phase, respectively. The remanent polarization value of the BET thin films annealed at $720^{\circ}C\;was\;25.95{\mu}C/cm^2$ at an applied voltage of 5 V.

• 한국전기전자재료학회논문지
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• 제27권2호
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• pp.97-103
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• 2014

Phase transition properties of the copolymer films of polyvinylidene fluoride (PVDF) and trifluoroethylene(TrFE), P(VDF-TrFE), were studied with X-ray diffraction (XRD) and polarization modulated ellipsometry (PME). XRD studies on both Langmuir-Blodgett (LB) films and spin coated films exhibit conversions from ferroelectric phase to paraelectric phase at $108{\pm}2^{\circ}C$ on heating and paraelectric phase to ferroelectric phase at $78{\pm}2^{\circ}C$ on cooling. The presence of the ferroelectric-paraelectric phase transition is also confirmed by the PME technique for the first time in this study. PME was proved to be a very sensitive tool in the measurement of the structural changes at the nano-thickness films.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1998년도 춘계학술대회 논문집
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• pp.83-86
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• 1998

Ferroelectric PZT(40/67)/PZT(60/40)heterolayered thin films were Prepared by the alkoxide-based Sol-Gel method. PZT(40/60) and PZT(60/40) stock solutions were made and spin-coated on the P7Ti/Si02/Si substrate alternately. These PZT(40/60) and PZT(60/40) films were dried at 300$^{\circ}C$ for 30min to remove organic materials and were sintered at 650$^{\circ}C$ for 1 hour to crystalize into a perovskite structure. The coating and heating procedure were repeated 6 times to form heterolayered films. Increasing the number of coating, coercive field was decreased. The relative dielectric constant, loss, remanent polarization and coercive field of the 4-coated PZT heterolayered were 1200, 4.1[%], 30.794[${\mu}$C/㎡] and 147.22[kV/cm], respectively.

• Bulletin of the Korean Chemical Society
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• 제25권11호
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• pp.1641-1644
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• 2004

Several [2]- and [3]rotaxanes bearing some functional groups on their wheel components and spacers with different lengths between two ammonium centers on their dumbbell components were prepared in good yields from dibenzo-24-crown-8-ether derivatives and dumbbell-shaped bis(sec-ammonium salt)s having a centrally located disulfide linkage, by utilizing the reversible thiol-disulfide interchange reaction. The shuttling behaviors of the [2]rotaxanes were investigated by $^1H$ NMR by use of the spin polarization transfer-selective inversion recovery technique. It was found that the change in spacer length in the axle resulted in a drastic change in shuttling rate of the [2]rotaxanes, although the introduction of the functional groups to the wheels did not affect the shuttling behavior at all.

• 한국전기전자재료학회논문지
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• 제11권1호
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• pp.57-61
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• 1998

In this study, PLZT stock solutions were prepared by Sol-Gel processing after the compositions were selected in the memory region of PLZT bulk phase diagram. PLZT solutions were deposited on the ITO glass substrate by spin-coating method. The thin films were annealed by rapid thermal processing. The electric characteristics, hysteresis loop, C-V characteristics of thin films in the memory region were measured in order to investigate the electrical characteristics of PLZT thin films. In selected compositions the decrease in Zr/Ti ratio led to an increase in dielectric constant and the decrease in remanent polarization and coercieve field which brought about slim hysteresis loop.

• EDISON SW 활용 경진대회 논문집
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• 제2회(2013년)
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• pp.205-209
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• 2013

본 실험에서는 탄소 cluster 중에서 fullerene 구조를 가질 수 있는 가장 작은 cluster인 $C_{20}$ cluster에 대해, 기존 연구에서 가장 안정한 것으로 제시된 cage(fullerene), bowl, ring의 3가지 구조와 $Si_{20}$ cluster를 모방한 구조 하나의 안정성을 확인하였다. ab-initio calculation을 지원하는 Edison nanophysics의 LCAODFLab을 이용하여 LDA-CA, GGA-PBE 두 가지 방법으로 계산하였다. 계산 값을 바탕으로 각 구조의 원자화에너지를 비교한 결과 LDA와 GGA 모두 cage, bowl, ring의 순서로 안정하였다. 최적화한 구조에 대하여 구조분석을 진행하였다. 최적화 결과 Bowl은 $C_{5v}$, ring은 $D_{10h}$, cage는 $C_{2h}$ 대칭성을 가지는 구조였으며, LDA, GGA 계산 모두 $C_{20}$ 구조의 spin polarization에는 영향을 받지 않았다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 C
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• pp.1703-1704
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• 2006

In this paper, PZT(20/80) thick films were fabricated by the screen-printing method. And the PZT(80/20) coating solution was synthesized by the sol-gel method. PZT(20/80) thick films were screen-printed on the alumina substrates. PZT(80/20) thin film was spin-coated on the PZT(20/80) thick films to obtain densification. And the structural and electrical properties of PZT thick films were investigated with variation of sintering temperature. The PZT specimen sintered at $650^{\circ}C$ showed good relative dielectric constant of 219 and dielectric loss of 2.45%. Also the remanent polarization and the coercive field were $16.48{\mu}C/cm^2$ and 35.48kV/cm, respectively.

• 한국자기학회지
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• 제15권1호
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• pp.1-6
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• 2005

높은 큐리온도를 가질 수 것으로 예측된 전이금속이 도핑된 ZnO의 전자구조와 자성을 제일원리계산방법을 이용하여 연구하였다. 본 연구에서 전이금속은 Ti, Cr, Mn, Fe, Co, Ni, Ru, Pd, Ag 이고 도핑 수준은 25%로 두고 계산하였다. 자성연구에서 가장 적합한 방법으로 알려져 있는 Full-potential Linearized Augmented Plane Wave(FLAPW)방법을 사용하였으며 교환-상관 전위는 general gradient approximation(GGA)를 사용하였다. 도핑된 전이금속 (Ti, Cr, Mn, Fe, Co, Ni, Ru, Pd, Ag)은 각각 0.83, 3.03, 4.03, 3.48, 2.47, 1.56, 0.43, 0.75, 0.01 ${\mu}_B$의 자기모멘트를 가지며, 전이금속에 이웃한 O 원자도 가안 띠혼성으로 측정 가능한 자기모멘트를 가질 수도 있는 것으로 계산되었다. 3d 전이금속이 도핑된 ZnO는 (CoZnO를 제외하고) 절반금속 특성을 가지는 것으로 계산되었다. 또한 4d 전이금속이 도핑된 경우는 강자성 상태가 상자성 상태에 비해 에너지차이가 크지 않을 뿐 아니라 페르미 준위에 다수 스핀과 소수 스핀 상태 모두가 페르미 준위에 위치해 있어 스핀분극 정도가 낮았다.

• 한국결정성장학회지
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• 제9권1호
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• pp.101-106
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• 1999

Pb$(Zr_{0.5},Ti_{0.5})O_3$ 박막을 $Pt/Ti/SiO_2/Si$ 기판 위에 spin-coating법으로 제조하였다. 제조된 sol을 초음파 bath 내에서 초음파 처리하여 균일화를 촉진시킨 다음, 박막을 제조하여 초음파 처리되지 않은 sol로 제조된 박막과의 비교를 통해 초음파의 영향을 고찰하였다. 초음파 처리된 sol로 제조된 박막의 경우, $550^{\circ}C$에서 perovskite 단일상을 얻을 수 있었고, "rosette" 구조가 사라졌음을 관찰할 수 있엇따. 초음파 처리되지 않은 sol로 제조된 박막의 유전상수(10kHz), 잔류분극(Pr) 및 항전계(Ec) 값은 335, 12.3$\mu$C/$\textrm{cm}^2$, 168.4 kV/cm 였고, 초음파 처리된 sol로 제조된 박막은 각각 443, 172$\mu$C/$\textrm{cm}^2$, 153,5kVcm 로 전기적 특성이 개선되어 졌음을 알 수 있었다.