• The Bulletin of The Korean Astronomical Society
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• v.38 no.1
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• pp.25-25
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• 2013

Review briefly results of the solar and stellar chemical abundances from the high resolution spectroscopy and discuss the solar composition problem and puzzles of the astronomical spectroscopic results.

• Proceedings of the KOSOMBE Conference
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• v.1997 no.11
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• pp.517-527
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• 1997

Magnetic Resonance Spectroscopic Imaging is a methodology combining the imaging and spectroscopy. It can provide the spectrum of each areas of image so that one can easily compare the spectrum of one position to another position of the image. In this study, we developed pulse sequence or the spectroscopic imaging method, RF wave forms or the saturation of water signal, computer simulations to validate our method, and confirmed the methodology with phantom experiment. Then we applied the spectroscopic method to human subject and identified a few important metabolites in in vivo. To develope a water saturating RF waveform, we used Shinnar-Le-Roux algorithm and obtained maximum phase RF waveform. With this RF pulse, it could suppress the water signal to 1:1000. The magnet is shimmed to under 1.0ppm with auto-shimming technique. The saturation bandwidth is 80Hz(2ppm). The water and fat seperation is 3.3ppm(about 140Hz at 1 Tesla magnet), the bandwidth is enough to resolve the difference. But we are more concerned about the narrow window in between the two peaks, in which the small quantity of metabolites reside. We performed the computer simulation and phantom experiments in 8*8 matrix form and showed good agreement in the image and spectrum. Finally we applied spectroscopic imaging to the brain of human subject. Only the lipid signal was shown in the periphery region which agrees with the at distribution in human head surface area. The spectrum inside the brain shows the important metabolites such as NAA, Cr/PCr, Choline. We here have shown the spectroscopic imaging which is normally done above 1.5 Tesla machine can be performed in the 1 Tesla Magnetic Resonance Imaging Unit.

• Proceedings of the Optical Society of Korea Conference
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• 2009.10a
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• pp.147-148
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• 2009

• Proceedings of the Optical Society of Korea Conference
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• 2001.02a
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• pp.256-259
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• 2001

Rotating-compensator type ellipsometer was developed for spectroscopic measurements. For accurate data reduction, the azimuths of transmission axises of polarizer and analyzer, and the angular position of the fast axis of compensator should be determined through calibration process. In this paper, we present various calibration methods.

• Bulletin of the Korean Space Science Society
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• 1993.10a
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• pp.20-30
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• 1993

Spectroscopic observations were made to study 42 emission line objects. The analysis of these long slit spectra shows that 15 out of 42 galaxies are blue compact galaxies. Among the 42 objects, 9 galaxies show the spectra of the typical starburst galaxy.

• 한국신재생에너지학회:학술대회논문집
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• 2008.05a
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• pp.378-381
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• 2008

고효율 a-Si:H/c-Si 이종접합 태양전지를 얻기 위해서는 우수한 c-Si wafer 위에 고품질의 비정질 실리콘박막을 통한 heterointerface를 형성하는 것이 매우 중요하다. 이를 달성하기 위해서는 공정중에 오염되기 쉬운 Si wafer 표면 상태를 정확히 검사하고 잘 관리하여야 한다. 본 연구에서는 세정 및 표면산화에 따른 Si wafer 상태를 Spectroscopic Ellipsometry 및 u-PCD를 이용하여 분석하였으며, <$\varepsilon$2> @4.25eV 값이 Si wafer 상태를 잘 나타내고 있음을 확인하였고 세정 최적화 할 경우 그 값이 43.02에 도달하였다. 또한 RF-PECVD로 증착된a-Si:H 박막을 EMA 모델링을 통해 분석한 결과 낮은 결정성과 높은 밀도를 가지는 a-Si:H를 얻을 수 있었으며, 이를 이종접합 태양전지에 적용한 결과 Flat wafer상에서 10.88%, textured wafer 적용하여 13.23%의 변환효율을 얻었다. 결론적으로 Spectroscopic Ellipsometry가 매우 얇고 고품질의 다층 박막이 필요한 이종접합 태양전지 분석에 있어 매우 유용한 방법임이 확인되었다.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.15 no.4
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• pp.157-161
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• 2005

Spectroscopic ellipsomerty measurements of the complex dielectric function of the CdTe thin films grown on GaAs(100) substrates by hot wall epitaxy have been performed in 1.5${\~}$5.5 eV photon energy range at room temperature. The spectroscopic ellipsometer spectra revealed distinct structures at energies of the $E_l,\;E_1+{\Delta}_1$, and $E_2$ critical points. These energies were decreased with increasing thickness of CdTe thin films.

• Bulletin of the Korean Chemical Society
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• v.27 no.11
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• pp.1819-1824
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• 2006

The general objective of the present study was to investigate the potential application of the UV spectroscopic method for determination of the polymeric additives present in papermaking fibrous stock solutions. The study also intended to establish the surface-chemical retention model associated with the adsorption kinetics of additives on fiber surfaces. Polyamide epichlorohydrin (PAE) wet strength resin and imidazolinium quaternary (IZQ) softening agents were selected to evaluate the analytical method. Concentrations of PAE and IZQ in solution were proportional to the UV absorption at 314 and 400 nm, respectively. The time-dependent behavior of polymeric additives obeyed a mono-molecular layer adsorption as characterized in Langmuir-type expression. The kinetic modeling for polymeric adsorption on fiber surfaces was based on a concept that polymeric adsorption on fiber surfaces has two distinguishable stages including initial dynamic adsorption phase and the final near-equilibrium state. The simulation model predicted not only the real-time additive adsorption behavior for polymeric additives at high accuracy once the kinetic parameters were determined, but showed a good agreement with the experimental data. The spectroscopic method examined on the PAE and IZQ adsorption study could potentially be considered as an effective tool for the wet-end retention control as applied to the paper industry.

• Korean Journal of Optics and Photonics
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• v.12 no.6
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• pp.472-478
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• 2001

We determined the optical constants and thickness of organic electroluminescence thin films using variable angle spectroscopic ellipsometry. Using the measured transmittance spectra and the spectroscopic ellipsomeoy data of the organic films on glass substrates in the optically transparent region, we determined the effective thickness and the refractive indices of organic thin films. Then by applying a numerical inversion method to variable angle spectro-ellipsometry data, we determined the complex refractive index at each wavelength including the optically absorbing region, as well as the thickness and surface micro-roughness of the organic thin films. The calculated transmittance spectra showed a tight agreement with the measured ones, confining the validity of the present model analysis.

• Current Optics and Photonics
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• v.1 no.1
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• pp.29-33
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• 2017

A method for analysis of thin film thickness in spectroscopic reflectometry is proposed. In spectroscopic reflectometry, there has been a trade-off between accuracy and computation speed using the conventional analysis algorithms. The trade-off originated from the nonlinearity of spectral reflectance with respect to film thickness. In this paper, the spectral phase is extracted from spectral reflectance, and the thickness of the film can be calculated by linear equations. By using the proposed method, film thickness can be measured very fast with high accuracy. The simulation result shows that the film thickness can be acquired with high accuracy. In the simulation, analysis error is lower than 0.01% in the thickness range from 100 nm to 4 um. The experiments also show good accuracy. Maximum error is under $40{\AA}$ in the thickness range $3,000-20,000{\AA}$. The experiments present that the proposed method is very fast. It takes only 2.6 s for volumetric thickness analysis of 640*480 pixels. The study suggests that the method can be a useful tool for the volumetric thickness measurement in display and semiconductor industries.