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Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry  

Jeen, Gwang-Soo (Department of Physics, Busan National University)
Jo, Jae-Hyuk (Department of Physics, Busan National University)
Park, Hyo-Yeol (Department of Semiconductors Applications, Ulsan College)
Publication Information
Journal of the Korean Crystal Growth and Crystal Technology / v.15, no.4, 2005 , pp. 157-161 More about this Journal
Abstract
Spectroscopic ellipsomerty measurements of the complex dielectric function of the CdTe thin films grown on GaAs(100) substrates by hot wall epitaxy have been performed in 1.5${\~}$5.5 eV photon energy range at room temperature. The spectroscopic ellipsometer spectra revealed distinct structures at energies of the $E_l,\;E_1+{\Delta}_1$, and $E_2$ critical points. These energies were decreased with increasing thickness of CdTe thin films.
Keywords
CdTe thin film; Spectroscopic ellipsomerty; Dielectric function;
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