A Study on Thermal Properties and Impurities Measurement of Semiconductive Shield by ICP-AES (ICP-AES에 의한 반도전재료의 불순물 측정 및 열적특성에 관한 연구)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2004.07a
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- pp.489-494
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- 2004