• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.3
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• pp.601-606
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• 2017

SRAM-based FPGAs mainly used to develop and implement high-performance circuits have SRAM-type configuration memory. Soft errors in memory devices are the main threat from a reliability point of view. Soft errors occurring in the configuration memory of FPGAs cause FPGAs to malfunction. SEM(Soft Error Mitigation) Controllers offered by Xilinx can mitigate the influence of soft errors in configuration memory. SEM Controllers use ECC(Error Correction Code) and CRC(Cyclic Redundancy Code) which are placed around the configuration memory to detect and correct the errors. The correction is done through a partial reconfiguration process. This paper presents the availability analysis of SRAM-based FPGAs against soft errors under the protection of SEM Controllers. Availability functions were derived and compared according to the correction capability of SEM Controllers of several different families of FPGAs. The result may help select an SRAM-based FPGA part and estimate the availability of FPGAs running in an environment where soft errors occur.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2016.10a
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• pp.655-658
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• 2016

Xilinx 7-Series FPGA(Field Programmable Gate Array)s mainly used for the implementation of high-performance digital circuit have SRAM-type configuration memory and can malfunction when soft errors occur in their configuration memory. SEM(Soft Error Mitigation Controller) offered by Xilinx helps users mitigate the influence of soft errors in configuration memory. When soft errors occur, SEM Controller can recover the state of FPGA through partial reconfiguration if the soft errors are correctable by ECC(Error Correction Code) and CRC(Cyclic Redundancy Code). This paper presents the availability analysis of Xilinx 7-Series FPGAs against soft errors under the protection of the SEM Controller. Availability functions are derived and compared according to the correction capability of the SEM Controller. The result may help to estimate the reliability of SRAM-based FPGA running in an environment where soft errors may occur.

• Nuclear Engineering and Technology
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• v.49 no.8
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• pp.1589-1599
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• 2017

Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems. The high logic density and advancements in architectural features make static random access memory (SRAM)-based FPGAs suitable for complex design implementations. Devices deployed in the nuclear environment face radiation particle strike that causes transient and permanent failures. The major reasons for failures are total ionization dose effects, displacement damage dose effects, and single event effects. Different from the case of space applications, soft errors are the major concern in terrestrial applications. In this article, a review of radiation effects on FPGAs is presented, especially soft errors in SRAM-based FPGAs. Single event upset (SEU) shows a high probability of error in the dependable application development in FPGAs. This survey covers the main sources of radiation and its effects on FPGAs, with emphasis on SEUs as well as on the measurement of radiation upset sensitivity and irradiation experimental results at various facilities. This article also presents a comparison between the major SEU mitigation techniques in the configuration memory and user logics of SRAM-based FPGAs.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.43 no.8 s.350
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• pp.69-76
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• 2006

In this paper, we propose blind adaptation strategies for decision feedback equalizer (DFE) optimizing the operation mode between acquisitionand tracking modes based on adjustable soft decision devices. The proposed schemes select an optimal soft decision device to generate feedback samples for the DFE at a given noise to signal ratio, and apply corresponding adaptation rules which combine a blind infinite impulse response (IIR) filtering adaptation and the decision-directed least mean squared (DD-LMS) DFE adaptation. These adaptation approaches attempt to achieve not only smooth transition between acquisition and tracking of DFE but also mitigation of error propagation.

• ETRI Journal
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• v.45 no.6
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• pp.929-938
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• 2023

The detection of all the symbols transmitted simultaneously in multiuser systems using limited wireless resources is challenging. Traditional model-based methods show high performance with perfect channel state information (CSI); however, severe performance degradation will occur if perfect CSI cannot be acquired. In contrast, data-driven methods perform slightly worse than model-based methods in terms of symbol error ratio performance in perfect CSI states; however, they are also able to overcome extreme performance degradation in imperfect CSI states. This study proposes a novel deep learning-based method by improving a state-of-the-art data-driven technique called deep soft interference cancellation (DSIC). The enhanced DSIC (EDSIC) method detects multiuser symbols in a fully sequential manner and uses an efficient neural network structure to ensure high performance. Additionally, error-propagation mitigation techniques are used to ensure robustness against channel uncertainty. The EDSIC guarantees a performance that is very close to the optimal performance of the existing model-based methods in perfect CSI environments and the best performance in imperfect CSI environments.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.15 no.4
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• pp.230-236
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• 2022

In this paper, we propose an efficient concatenated code for both random and ISI errors on diffusion-based molecular communication channels. The proposed concatenated code was constructed by combining the ISI-mitigating code designed for ISI mitigation and the ISI-Hamming code strong against random errors, and the BER(bit error rate) performance was analyzed through simulation. In the case of the above M=1,200 channel environment, it was found that the error rate performance of the concatenated code follows the error rate performance of the ISI-mitigating code, which is strong against ISI, and follows the error rate performance of the ISI-Hamming code, which is strong against random errors, in the channel environment below M=600. In M=600~1,200, the concatenated code shows the best error rate performance among those of three codes, which is analyzed because it can correct both random errors and errors caused by ISI. In the following cases of below M=800, it can be seen that the error rate of the concatenated code and the ISI-mitigating code shows an error rate difference of about 1.0×10^-1 on average.