• Proceedings of the Optical Society of Korea Conference
• /
• 1991.07a
• /
• pp.129-134
• /
• 1991

반도체 물질들은 일반적으로 흡수 끝 (absorption edge) 근처에서 비선형 광학 계수가 이례적으로 크고, 그 반응 속도가 빠른 특성을 갖고 있다. 본 논문에서는 반도체와 반도체 미세구조에 있어서의 비선형 광학적 특성 및 초고속 논리 광소자로서의 응용을 고찰하였다.

• Proceedings of the Optical Society of Korea Conference
• /
• 2005.02a
• /
• pp.290-291
• /
• 2005

We have presented a comprehensive effective-mass Hamiltonian for strained Wurtzite semiconductors using k${\cdot}$p method and Kane's model. This theoretical groundwork provides a foundation for investigating the electrical and optical properties of wurtzite strained quantum-well lasers.

• Proceedings of the Korean Society of Potoscience Conference
• /
• spring
• /
• pp.87-87
• /
• 1999

• Proceedings of the Korean Society of Potoscience Conference
• /
• spring
• /
• pp.33-33
• /
• 1996

• Proceedings of the Korean Magnestics Society Conference
• /
• 2004.06a
• /
• pp.170-171
• /
• 2004

• Proceedings of the Korean Magnestics Society Conference
• /
• 2008.12a
• /
• pp.73.1-73.1
• /
• 2008

• Journal of Power Electronics
• /
• v.15 no.3
• /
• pp.841-848
• /
• 2015

As a vital part of renewable energy and electrical traction, power converters are supposed to have high reliability and good performance. However, power semiconductors produce considerable heat when the power converter works, which results in high junction temperatures that lower the reliability and performance of the power semiconductors. Many studies show that ambient humidity has a significant effect on power devices, but the influence of high humidity on junction temperatures has yet to be studied. Therefore, this paper presents a thermal model for power converters in moist air to obtain the junction temperature increase, which is utilized for the power converter used in a Switched Reluctance Motor System. Simulation results show that the law of converter temperature distribution is independent of the relative humidity in the case of fixed ambient temperature, whereas the temperature in the power converter decreases as the ambient relative humidity increases. These simulation results are validated with the experimental results.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.08a
• /
• pp.256-256
• /
• 2012

Oxide semiconductors such as zinc tin oxide (ZTO) or indium gallium zinc oxide (IGZO) have attracted a lot of research interest owing to their high potential for application as thin film transistors (TFTs) [1,2]. However, the instability of oxide TFTs remains as an obstacle to overcome for practical applications to electronic devices. Several studies have reported that the electrical characteristics of ZnO-based transistors are very sensitive to oxygen, hydrogen, and water [3,4,5]. To improve the reliability issue for the amorphous InGaZnO (a-IGZO) thin-film transistor, back channel passivation layer is essential for the long term bias stability. In this study, we investigated the instability of amorphous indium-gallium-zinc-oxide (IGZO) thin film transistors (TFTs) by the back channel contaminations. The effect of back channel contaminations (humidity or oxygen) on oxide transistor is of importance because it might affect the transistor performance. To remove this environmental condition, we performed vacuum seasoning before the deposition of hybrid passivation layer and acquired improved stability. It was found that vacuum seasoning can remove the back channel contamination if a-IGZO film. Therefore, to achieve highly stable oxide TFTs we suggest that adsorbed chemical gas molecules have to be eliminated from the back-channel prior to forming the passivation layers.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2016.02a
• /
• pp.100-100
• /
• 2016

Among various two-dimensional (2D) materials, 2D semiconductors and insulators have attracted a great deal of interest from nanoscience community beyond graphene, due to their attractive and unique properties. Such excellent characteristics have triggered highly active researches on 2D materials, such as hexagonal boron nitride (hBN), molybdenum disulfide (MoS2), and tungsten diselenide (WSe2). New physics observed in 2D semiconductors allow for development of new-concept devices. Especially, these emerging 2D materials are promising candidates for flexible and transparent electronics. Recently, van der Waals heterostructures (vdWH) have been achieved by putting these 2D materials onto another, in the similar way to build Lego blocks. This enables us to investigate intrinsic physical properties of atomically-sharp heterostructure interfaces and fabricate high performance optoelectronic devices for advanced applications. In this talk, fundamental properties of various 2D materials will be introduced, including growth technique and influence of defects on properties of 2D materials. We also fabricate high performance electronic/optoelectronic devices of vdWH, such as transistors, memories, and solar cells. The device platform based on van der Waals heterostructures show huge improvement of devices performance, high stability and transparency/flexibility due to unique properties of 2D materials and ultra-sharp heterointerfaces. Our work paves a new way toward future advanced electronics based on 2D materials.

• Transactions on Electrical and Electronic Materials
• /
• v.10 no.4
• /
• pp.111-115
• /
• 2009

We present a study on the reflection of optically controlled microwave pulses from non uniform plasma layers in semiconductors. The transient response of the microwave pulses in different plasma layers has been evaluated by means of the reflection function of dielectric microstrip lines. The lines were used with an open-ended termination containing an optically induced plasma region, which was illuminated by a light source. The reflection characteristics impedance resulting from the presence of plasma is evaluated by means of the equivalent transmission line model. We have analyzed the variation of the transient response in a 0.01 cm layer with a surface frequency in the region of 128 GHz. In the reflection the variation of the diffusion length $L_D$ is large compared with the absorption depth $1/{\alpha}_l$. The variation of the characteristic response of the plasma layer with differentially localized pulses has been evaluated analytically. The change of the reflection amplitude has been observed at depths of 0.1 cm, 0.01 cm and $0.1{\times}10^{-5}$ cm respectively.