• Journal of the Korea Academia-Industrial cooperation Society
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• v.21 no.3
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• pp.129-136
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• 2020

A Cut Out Switch (COS) is used for line protection and pole transformer protection in power systems. The COS used to protect the pole transformer is installed on the power side of the pole transformer to protect the electric equipment from fault currents. The COS is composed largely of a body and a fuse holder, and when the fault current is energized, the element of the fuse link in the fuse holder is melted to block the fault current. The arc generated when the COS fuse link is blown causes fire and noise, causing discomfort to residents in the surrounding area, and the arc flame can cause secondary damage to the peripheral device. In this study, a current-limiting COS fuse with improved overcurrent blocking performance rather than explosion type was developed to solve the arc and noise problems during COS operation. The overcurrent breaking performance of the current-limiting COS improves the reliability by developing a striker and COS fuse bracket. In addition, this study aimed to verify the performance of the developed current-limiting COS fuse through a test at an authorized institution.

• Applied Microscopy
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• v.2 no.1
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• pp.39-46
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• 1972

There are many kinds of microscopes suitable for general studies; optical microscopes(OM), conventional transmission electron microscopes (TEM), and scanning electron microscopes(SEM). The optical microscopes and the conventional transmission electron microscopes are very familiar. The images of these microscopes are directly formed on an image plane with one or more image forming lenses. On the other hand, the image of the scanning electron microscope is formed on a fluorescent screen of a cathode ray tube using a scanning system similar to television technique. In this paper, the features and some applications of the scanning electron microscope will be discussed briefly. The recently available scanning electron microscope, combining a resolution of about $200{\AA}$ with great depth of field, is favorable when compared to the replica technique. It avoids the problem of specimen damage and the introduction of artifacts. In addition, it permits the examination of many samples that can not be replicated, and provides a broader range of information. The scanning electron microscope has found application in diverse fields of study including biology, chemistry, materials science, semiconductor technology, and many others. In scanning electron microscopy, the secondary electron method. the backscattererd electron method, and the electromotive force method are most widely used, and the transmitted electron method will become more useful. Change-over of magnification can be easily done by controlling the scanning width of the electron probe. It is possible. to continuously vary the magnification over the range from 100 times to 1.00,000 times without readjustment of focusing. Conclusion: With the development of a scanning. electron microscope, it is now possible to observe almost all-information produced through interactions between substances and electrons in the form of image. When the probe is properly focused on the specimen, changing magnification of specimen orientation does not require any change in focus. This is quite different from the conventional transmission electron microscope. It is worthwhile to note that the typical probe currents of $10^{-10}$ to $10^{-12}\;{\AA}$ are for below the $10^{-5}$ to $10^{-7}\;{\AA}$ of a conventional. transmission microscope. This reduces specimen contamination and specimen damage due to heatings. Outstanding features of the scanning electron microscope include the 'stereoscopic observation of a bulky or fiber specimen in high resolution' and 'observation of potential distribution and electromotive force in semiconductor devices'.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.22 no.5
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• pp.22-33
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• 2021

In the case of open phase faults caused by the disconnection of distribution feeders interconnected to a PV system, many problems can occur depending on the core type and wiring method of the grid-connected transformers. Moreover, open phase faults are difficult to detect because the open phase voltage of the existing protection relay (Open Phase Relay (47)) can be maintained, even though a disconnection fault occurred, depending on the wiring method and the iron core type of the grid-connected transformer for a PV system. Therefore, this paper proposes a novel algorithm to detect open phase faults by comparing the currents and phases between the primary and secondary sides of a grid-connected transformer. In addition, this paper presents the modeling of a distribution system and protection devices for detecting open phase faults using PSCAD/EMTDC S/W, and implements a test protection device for detecting open phase faults based on the above-mentioned modeling. The simulation and test results confirmed that the proposed algorithm is useful for detecting open phase faults according to the wiring method and iron core type of grid-connected transformer for a PV system because operation slope and unbalance rate of the primary current exceed the setting value (30[%]) of the protection device.