• Title/Summary/Keyword: scattering coefficients

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A Study on H-polarized Electromagnetic Scattering by a Resistive Strip Grating Between a Grounded Double Dielectric Layer (접지된 2중 유전체층 사이의 저항띠 격자구조에 의한 H-polarized 전자파 산란에 관한 연구)

  • Yoon, Uei-Joong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.22 no.1
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    • pp.29-34
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    • 2022
  • In this paper, thr H-polarized scattering problems by a resistive strip grating in a grounded double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. The %error of the convergence of the reflected power according to the relative permittivity of the dielectric layer and the size of the number of rows in the square matrix was compared, as the size of the number of rows in the square matrix increased, the accuracy of the reflected power increased. As the resistivity of the resistive strip decreased, the thickness of the dielectric layers decreased, and the relative permittivity of the dielectric layers increased, the reflected power increased. The numerical results for the presented structure of this paper having a grounded double dielectric layer are shown in good agreement compared to those of the existing papers.

Solution of TE Scattering Applying FGMM for Resistive Strip Grating Between a Grounded Double Dielectric Layer (접지된 2중 유전체층 사이의 저항띠 격자에 대해 FGMM을 적용한 TE 산란 해)

  • Uei-Joong Yoon
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.23 no.3
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    • pp.71-76
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    • 2023
  • In this paper, TE(transverse electric) scattering problems by a resistive strip grating between a grounded double dielectric layer are analyzed by applying the FGMM(fourier galerkin moment method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. Overall, as the resistivity decreased, the magnitude of the current density induced in the resistive strip increased, and the reflected power also increased. In case of uniform resistivity, the reflected power decreased as the relative permittivity of the dielectric layers increased or the thickness of the dielectric layer increased. The numerical results for the presented structure in this paper are shown in good agreement compared to those of the existing papers.

Solution of TM Scattering Applying FGMM and PMM for Conductive Strip Grating Between a Grounded Double Dielectric Layers (접지된 2중 유전체층 사이의 도체띠 격자에 대해FGMM과 PMM을 적용한 TM 산란 해)

  • Uei-Joong Yoon
    • The Journal of the Convergence on Culture Technology
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    • v.9 no.3
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    • pp.721-726
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    • 2023
  • In this paper, TM electromagnetic scattering problems for conductive strip grating between grounded double dielectric layers are analyzed by applying the FGMM(fourier galerkin moment method) and PMM(point matching method) known as a numerical method of electromagnetic field. The boundary conditions are applied to obtain the unknown field coefficients. In order to deal with the problem of grounded double dielectric layers, numerical calculation was performed only when the thickness and relative permittivity of the dielectric layers had the same value. As the thickness of the dielectric layer and the relative permittivity increased, the overall reflected power increased, and the minimum values of the reflected power shifted in the direction of increasing the strip width. The numerical results obtained by applying the numerical methods of FGMM and PMM to the structure proposed in this paper agree very well.

Solution of TE Scattering by a Resistive Strip Grating Between a Double Dielectric Layer Using FGMM (FGMM을 이용한 2중 유전체층 사이의 저항띠 격자구조에 의한 TE 산란 해)

  • Uei-Joong Yoon
    • The Journal of the Convergence on Culture Technology
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    • v.9 no.3
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    • pp.619-624
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    • 2023
  • In this paper, TE(transverse electric) scattering problems by a resistive strip grating between a double dielectric layer are analyzed by using the FGMM(fourier galerkin moment method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. In order to deal with the problem of the double dielectric layer, numerical calculation was performed only when the thickness and relative permittivity of the dielectric layers had the same value. Overall, as the resistivity of the uniform resistivity increased, the current density induced in the resistive strip decreased, the reflected power decreased, and the transmitted power relatively increased. The numerical results of the structure proposed in this paper are shown in good agreement compared to the results of PMM, a numerical analysis method of the existing paper.

Solution of E-polarized Scattering by a Resistive Strip Grating Between a Double Dielectric Layer Using FGMM (FGMM을 이용한 2중 유전체층 사이의 저항띠 격자구조에 의한 TM 산란 해)

  • Uei-Joong Yoon
    • The Journal of the Convergence on Culture Technology
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    • v.9 no.3
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    • pp.641-646
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    • 2023
  • In this paper, TM(transverse magnetic) scattering problems by a resistive strip grating between a double dielectric layer are analyzed by using the FGMM(fourier galerkin moment method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. Overall, as the uniform resistivity of the resistive strip increased, the size of the current density induced in the resistance band decreased, the reflected power decreased, and the transmitted power increased. In addition, As the thickness of the dielectric layer increased, the reflected power increased and the transmitted power relatively decreased. The numerical results of the structure proposed in this paper are shown in good agreement compared to the results of PMM, a numerical analysis method of the existing paper.

A Study of the Characteristics of Highly Spatially Resolved CW-laser-based Aerosol Lidar (고공간분해능 연속 광원을 이용한 미세먼지 라이다의 신호 특성에 관한 연구)

  • Sim, Juhyeon;Kim, Taekeong;Ju, Sohee;Noh, Youngmin;Kim, Dukhyeon
    • Korean Journal of Optics and Photonics
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    • v.33 no.1
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    • pp.1-10
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    • 2022
  • In this study we introduce a new method for high-spatial-resolution continuous wave (CW) aerosol lidar that has a high spatial resolution in the near field and a low spatial resolution at long distances. A normal lidar system uses a nanosecond-pulse laser and measures the round-trip TOF between the aerosol and laser to obtain range resolution. In this study, however, we propose a new type of spatially resolving aerosol lidar that uses laser-scattering images. Using a laser-light-scattering image, we have calculated the distance of each scattering aerosol image for a given pixel, and recovered the short-range aerosol extinction. For this purpose, we have calculated the distance image and the contribution range of the aerosol to the given one-pixel image, and finally we have calculated the extinction coefficients of the aerosol with range-resolved information. In the case of traditional aerosol lidar, we can only obtain the aerosol extinction coefficients above 400 m. Using our suggested method, it was possible to extend the range of the extinction coefficient lower then several tens of meters. Finally, we can remove the unknown short-range region of pulsed aerosol lidar using our method.

Comparison of Two Semi-Empirical BRDF algorithms using SPOT/VGT

  • Lee, Chang Suk;Han, Kyung-Soo
    • Korean Journal of Remote Sensing
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    • v.29 no.3
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    • pp.307-314
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    • 2013
  • The Bidirectional Reflectance Distribution (BRD) effect is critical to interpret the surface information using remotely sensed data. This effect was caused by geometric relationship between sensor, target and solar that is inevitable effect for data of optical sensor. To remove the BRD effect, semi-empirical BRDF models are widely used. It is faster to calculate than physical models and demanded less observation than empirical models. In this study, Ross-Li kernel and Roujean kernel were used respectively in National Aeronautics and Space Administration (NASA) and European Organization for the Exploitation of Meteorological Satellites (EUMETSAT) that are used to compare each other. The semi-empirical model consists of three parts which are isotropic, geometric and volumetric scattering. Each part contained physical kernel and empirical coefficients that were calculated by statistical method. Red and NIR channel of SPOT/VEGETATION product were used to compute Nadir BRDF Adjusted Reflectance (NBAR) over East Asia area from January 2009 to December 2009. S1 product was provided by VITO that was conducted atmospheric correction using Simplified Method of Atmospheric Correction (SMAC). NBAR was calculated using corrected reflectance of red and NIR. Previous study has revealed that Roujean geometric kernel had unphysical values in large zenith angles. We extracted empirical coefficients in three parts and normalized reflectance to compare both BRDF models. Two points located forest in Korea peninsular and bare land in Gobi desert were selected for comparison. As results of time series analysis, both models showed similar reflectance change pattern and reasonable values. Whereas in case of empirical coefficients comparison, different changes pattern of values were showed in isotropic coefficients.

A Study on the Temperature dependent Impact ionization for GaAs using the Full Band Monte Carlo Method (풀밴드 몬데카를로 방법을 이용한 GaAs 임팩트이온화의 온도 의존성에 관한 연구)

  • 고석웅;유창관;정학기
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.4 no.3
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    • pp.697-703
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    • 2000
  • As device dimensions are lastly scaled down, impact ionization(I.I.) events are very important to analyze hot carrier transport in high energy region, and the exact model of impact ionization is demanded on device simulation. We calculate full band model by empirical pseudopotential method and the impact ionization rate is derived from modified Keldysh formula. We calculate impact ionization coefficients by full band Monte Carlo simulator to investigate temperature dependent characteristics of impact ionization for GaAs as a function of field. Resultly impact ionization coefficients are in good agreement with experimental values at look. We how energy is increasing along increasing the field, while energy is decreasing along increasing the temperature since the phonon scattering rates for emission mode are very high at high temperature. The logarithmic fitting function of impact ionization coefficients is described as a second orders function of temperature and field. The residuals of the logarithmic fitting function are mostly within 5%. We Dow, therefore, the logarithm of impact ionization coefficients has quadratic dependence on temperature, and we can save time of calculating the temperature dependent impact ionization coefncients as a function of field.

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The Temperature- and Field-dependent Impact ionization Coefficient for Silicon using Monte Carlo Simulation (Monte Carlo 시뮬레이션을 이용한 Si 임팩트이온화계수의 온도 및 전계 특성)

  • 유창관;고석웅;김재홍;정학기;이종인
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2000.05a
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    • pp.451-454
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    • 2000
  • The impact ionization(I.I.) is necessary to analyze carrier transport properties under the influence of high electric field. The full band I-k relation and Fermi's golden rule are used for the calculation of impact ionization rate. We have investigated the temperature- and field-dependent impact ionization coefficient for silicon using full band Monte Carlo simulation. The impact ionization coefficients calculated by our impact ionization model are agreed with experimental data at look. We know that impact ionization coefficients and electron energies are decreasing along increasing temperature due to increase of phonon scattering, especially by emission. The logarithm of impact ionization coefficients are fitted to linear function for temperature and field. The residuals of linear function are within the error bound of 5%. We know logarithmic impact ionization coefficients are linearly dependent on temperature and field.

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Verification of a Calibration Technique for a Full-Polarimetric Scatterometer System at C-band (C-밴드 완전 편파 측정용 스캐터미터 시스템 보정 기술 검증)

  • Park, Sin-Myeong;Go, Joo-Seoc;Joo, Jeong-Myeong;Kim, Hee-Young;Kim, Ju-Hui;Hwang, Ji-Hwan;Kwon, Soon-Gu;Shin, Jong-Chul;Oh, Yisok
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.23 no.10
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    • pp.1196-1203
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    • 2012
  • This paper presents a study on the calibration of a C-band HPS(Hongik Polarimetric Scatterometer) system using the DMMCT(Differential Mueller Matrix Calibration Technique). For calibration of the polarimetric scatterometer system, a fully-polarimetric antenna pattern(magnitudes and phase-differences) of the antenna main-beam is measured using a conducting sphere at anechoic chamber. The polarimetric scatterometer system could be accurately calibrated after retrieving its distortions using the DMMCT. Unlike a single-polarimetric system, in a fully-polarimetric system, not only backscattering coefficients but also phase differences are important parameters. This calibrated HPS system can be used to measure accurate Mueller matrices of bare soil surfaces, rice paddies, and vegetation fields. The phase-difference parameters as well as the backscattering coefficients for co- and cross-polarizations can then be obtained. The accuracy of calibration was verified by comparing the measured backscattering coefficients with a scattering model. The measured polarization response of a plowed bare field was also compared with the polarization response which was synthesized using a polarimetric scattering model for verifying the calibration technique.