• Proceedings of the Optical Society of Korea Conference
• /
• 2004.02a
• /
• pp.30-31
• /
• 2004

• Proceedings of the Optical Society of Korea Conference
• /
• 2006.02a
• /
• pp.215-216
• /
• 2006

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.4
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• pp.10-17
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• 2007

FTIR(Fourier Transform Infrared) spectrometry is a useful method to obtain infrared spectra of materials in gas phase by registering the interferogram of a target material using an interferometer, and then performing a Fourier transform on the interferogram to obtain the spectrum. In this paper, sampling noise effect on signal processing of the rapid scan interferometer was studied with relation to sampling the interferogram points at the improper location and empirically verified.