• 한국정밀공학회지
• /
• 제26권7호
• /
• pp.65-72
• /
• 2009

Laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example out-of-plane ESPI (Electronic Speckle Pattern Interferometry), in plane ESPI, shearography and holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact. This paper reports on a new approach to the LD (Laser Diode) Modulating interferometry that involves four-frame phase shift method. This study proposes a four-frame phase mapping algorithm, which was developed to have a guaranteed application, to stabilize the system in the field and to be a user-friendly GUI. In this paper, the theory for LD wavelength modulation and sinusoidal phase modulation of LD modulating interferometry is shown. Using modulating laser and research of measurement algorithm does comparison with existent ESPI measurement algorithm. Algorithm measures using GPIB communication through most LabVIEW 8.2. GPIB communication does alteration through PC. Transformation of measurement object measures through modulating laser algorithm that develops. Comparison of algorithm of modulating laser developed newly with existent PZT algorithm compares transformation price through 3-D. Comparison of 4-frame phase mapping, unwrapping, 3-D is then introduced.

• 비파괴검사학회지
• /
• 제32권2호
• /
• pp.177-184
• /
• 2012

ESPI는 비접촉 비파괴 방식으로 측정 대상체의 진동이나 변형에 따른 3차원 형상 정보의 취득에 효과적으로 사용되어 왔다. 측정 대상체와 계측 환경에 따라 면내, 면외, 전단간섭 등으로 구분할 수 있으며, 간섭계를 구성하는 광소자의 형태에 따라 벌크형과 광섬유형으로 나뉜다. 광섬유형 시스템은 크기가 작고 휴대하기 편하여 시스템 구성 및 정렬이 매우 용이하다. 본 논문에서는 광섬유 면외 ESPI를 이용한 광학계를 구성하였고, PZT를 이용하여 위상 변조를 ${\pi}/2$만큼 주기적으로 가하여 CCD 카메라에서 이미지를 획득하였다. 획득한 스페클 패턴 이미지는 후처리 과정을 통해 측정 대상체의 3차원 위상 정보를 얻게 된다. 내부 결함이 존재하는 압력용기에 질소 가스를 주입하여 변화되는 phase map을 관찰하였고, 또한 phase map의 후처리를 통하여 압력에 따른 대상체의 변화를 3차원으로 확인하였다.