• 대한산업공학회지
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• 제43권3호
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• pp.164-175
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• 2017

Dual response surface optimization (DRSO) attempts to optimize mean and variability of a process response variable using a response surface methodology. In general, mean and variability of the response variable are often in conflict. In such a case, the process engineer need to understand the tradeoffs between the mean and variability in order to obtain a satisfactory solution. Recently, a Posterior preference articulation approach to DRSO (P-DRSO) has been proposed. P-DRSO generates a number of non-dominated solutions and allows the process engineer to select the most preferred solution. By observing the non-dominated solutions, the DM can explore and better understand the trade-offs between the mean and variability. However, the non-dominated solutions generated by the existing P-DRSO is often incomprehensive and unevenly distributed which limits the practicability of the method. In this regard, we propose a modified P-DRSO using multiple objective genetic algorithms. The proposed method has an advantage in that it generates comprehensive and evenly distributed non-dominated solutions.

• Communications for Statistical Applications and Methods
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• 제7권3호
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• pp.773-788
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• 2000

Statistical process control (SPC) and engineering process control (EPC) are based on different strategies for processes quality improvement. SPC reduces process variability by detecting and eliminating special causes of process variation. while EPC reduces process variability by adjusting compensatory variables to keep the quality variable close to target. Recently there has been needs for a process control proceduce which combines the tow strategies. This paper considers a combined scheme which simultaneously applies SPC and EPC techniques to reduce the variation of a process. The process model under consideration is an integrated moving average(IMA) process with a step shift. The EPC part of the scheme adjusts the process back to target at every fixed monitoring intervals, which is referred to a repeated adjustment scheme. The SPC part of the scheme uses an exponentially weighted moving average(EWMA) of observed deviation from target to detect special causes. A Markov chain model is developed to relate the scheme's expected cost per unit time to the design parameters of he combined control scheme. The expected cost per unit time is composed of off-target cost, adjustment cost, monitoring cost, and false alarm cost.

• 품질경영학회지
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• 제32권2호
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• pp.201-211
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• 2004

Process adjustment is a complimentary tool to process monitoring in process control. Process adjustment directs on maintaining a process output close to a target value by manipulating another controllable variable, by which significant process improvement can be achieved. Therefore, this approach can be applied to the 'Improve' stage of Six Sigma strategy. Though the optimal control rule minimizes process variability in general, it may not properly function when special causes occur in underlying process, resulting in off-target bias and increased variability in the adjusted output process, possibly for long periods. In this paper, we consider a responsive feedback control system and the minimum mean square error control rule. The bias in the adjusted output process is investigated in a general framework, especially focussing on stationary underlying process and the special cause of level shift type. Illustrative examples are employed to illustrate the issues discussed.

• Communications for Statistical Applications and Methods
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• 제7권2호
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• pp.435-446
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• 2000

Statistical process control(SPC) and engineering process control(EPC) are two strategies for quality improvement that have been developed independently. EPC seeks to minimize variability by adjusting compensatory variables in order to make the process level close to the target, while SPC seeks to reduce variability by monitoring and eliminating causes of variation. One purpose of this paper is to propose the IMA(0,1,1) model as the in-control process model. For the out-of-control process model we consider two cases; one is the case with a step shift in the level, and the other is the case with a change in the nonstationarity. Another purpose is to suggest the use of an integrated process control procedure with adjustment and monitoring, which can consider the proposed process model effectively. An integrated control procedure will improve the process control activity significantly for cases of the proposed model, when compared to the procedure of using either EPC or SPC, since EPC will keep the process close to the target and SPC will eliminate special causes.

• 한국품질경영학회:학술대회논문집
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• 한국품질경영학회 2004년도 품질경영모델을 통한 가치 창출
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• pp.425-429
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• 2004

Process adjustment Is a complimentary tool to process monitoring in process control. Process adjustment directs on maintaining a process output close to a target value by manipulating another controllable variable, by which significant process improvement can be achieved. Therefore, this approach can be applied to the 'Improve' stage of Six Sigma strategy. Though the optimal control rule minimizes process variability in general, it may not properly function when special causes occur in underlying process, resulting in off-target bias and increased variability in the adjusted output process, possibly for long periods. In this paper, we consider a responsive feedback control system and the minimum mean square error control rule. The bias in the adjusted output process is investigated in a general framework, especially focussing on stationary underlying process and the special cause of level shift type. Illustrative examples are employed to illustrate the issues discussed.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2008년도 추계학술대회
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• pp.599-610
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• 2008

It is an important and urgent issue to improve process capability in quality control. Process capability refers to the uniformity of the process. The variability in the process is a measure of the uniformity of output. A simple, quantitative way to express process capability, the degree of variability from target in specification is defined by process capability index(PCI). Almost process capability indices are defined under normal distribution. However, these indices can not be applied to the process of non-normal distribution including reliability. We investigate current research on the process of non-normal distribution, and advanced method and technology for developing more reliable and efficient PCI. Finally we suggest the perspective for future study.

• 대한안전경영과학회지
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• 제13권4호
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• pp.225-235
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• 2011

Autoregressed Controller, which have trend algorithm, seeks to minimize variability by transferring the output variable to the related process input variable, while multivariate process control techniques seek to reduce variability by detecting and eliminating assignable causes of variation. In the case of process control, a very reasonable objective is to try to minimize the variance of the output deviations from the target or set point. We also investigate algorithm with relevant Shewhart chart, Theoretical control charts, precontrol and process capability. To help the people who want to make the theoretical system, we compare the main techniques in "a study on the relation between multivariate process control techniques and trend algorithms".

• 산업경영시스템학회지
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• 제24권63호
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• pp.45-54
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• 2001

The process capability indices have been widely used in manufacturing industries to provide numerical measures of process potential and performance. This study is concerned with process controls and adjustments by incapability index $C_{pp}$ and its sub-indices. A monitoring for $\^{C}_{pp}$ would provide a convenient way to monitor changes on process capability after statistical control is established, since $C_{pp}$ simultaneously measures process variability and centering. Further, we can separate charting of process location and variability by sub-indices of $C_{pp}$, ($C_{ia}$, $C_{ip}$), without returning to $\={x}$-R chart, even though an out-of-control signals on $\^{C}_{pp}$ control chart is found.

• 한국통계학회:학술대회논문집
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• 한국통계학회 2004년도 학술발표논문집
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• pp.179-184
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• 2004

Statistical process control (SPC) and engineering process control (EPC) are based on different strategies for process quality improvement. SPC reduces process variability by detecting and eliminating special causes of process variation, while EPC reduces process variability by adjusting compensatory variables to keep the quality variable close to target. Recently there has been need for an integrated process control (IPC) procedure which combines the two strategies. This article considers a scheme that simultaneously applies SPC and EPC techniques to reduce the variation of a process. The process disturbance model under consideration is an IMA(1,1) model with a location shift. The EPC part of the scheme adjusts the process, while the SPC part of the scheme detects the occurrence of a special cause. For adjusting the process repeated adjustment is applied by compensating the predicted deviation from target. For detecting special causes the two kinds of exponentially weighted moving average (EWMA) control chart are applied to the observed deviations: One for detecting location shift and the other for detecting increment of variability. It was assumed that the adjustment of the process under the presence of a special cause may change any of the process parameters as well as the system gain. The effectiveness of the IPC scheme is evaluated in the context of the average cost per unit time (ACU) during the operation of the scheme. One major objective of this article is to investigate the effects of the process parameters to the ACU. Another major objective is to give a practical guide for the efficient selection of the parameters of the two EWMA control charts.

• 천문학회보
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• 제46권2호
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• pp.35.1-35.1
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• 2021

Variability in young stellar objects (YSOs) can be caused by various time-dependent phenomena associated with star formation, including accretion rates, geometric changes in the circumstellar disks, stochastic hydromagnetic interactions between stellar surfaces and inner disk edges, reconnections within the stellar magnetosphere, and hot/cold spots on stellar surfaces. Among these YSO variability phenomena, bursts of accretion, which are the most remarkable variability, usually occur sporadically, making it challenging to catch the bursting moments observationally. However, the burst accretion process significantly affects the chemical conditions of the disk and envelope of a YSO, which can be used as a prominent tracer of episodic accretion. I will introduce our ensemble studies of YSO variability at mid-IR and submillimeter and also cover the ALMA observations of several YSOs in the burst accretion phase, especially in the view of chemistry.