• Title/Summary/Keyword: point to point(PTP) measurement

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The Development and Evaluation of OMM(On the Machine Measuring) System Using Scanning Probe (Scanning Probe를 이용한 OMM(On the Machine Measuring) 시스템 개발 및 평가)

  • Kim, S.H.;Kim, I.H.
    • Journal of the Korean Society for Precision Engineering
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    • v.13 no.10
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    • pp.71-77
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    • 1996
  • This paper describes the development of on the machine measuring(OMM) system which can directlry measure the three dimensional machined dimensilnal accuracy using scanning probe in milling machine. Two algolithms, continuous path(CP) measurement using UC program and CAD data assisted point to point(PTP) measurement, were developed regarding specification of scanning probe. The OMM system was contructed to verify the developed system suing the proposed algorithm, and actually measured three kinds of machined TV shadow mask molds. The developed system was evaluated it's repeatability and compared with the current measurement system of CMM(Coording Measuring Machine) in terms of relative accuracy and time reduction and productivity increase.

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The Analysis of Measuring Error in OMM System (OMM 시스템에서의 측정오차 해석)

  • 이상준;김선호;김옥현
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.5
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    • pp.34-42
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    • 1998
  • This paper describes an analysis of measuring error of on the machine measuring(OMM) system which directly measures machined surface dimensions using scanning probe on a CNC milling machine. 21 inch TV shadow mask mould clamped to a pallet was measured using PTP(point to point) measuring algorithm in OMM system and the results were compared with those using coordinate measuring machine(CMM). The OMM error was evaluated by probe error, stylus contact error, center shift error, repeatability, work-piece clamping error and etc. The results show that elastic deformation of the pallet is most affecting factor on the measuring error, thus pallet design and clamping method need very careful cosiderations.

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Development of On-the-Machine Measurement(OMM) System (기상측정(機上測定) 시스템 개발)

  • Lee, Seung-Woo;Kim, Sun-Ho
    • IE interfaces
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    • v.11 no.1
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    • pp.199-205
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    • 1998
  • This paper describes the development of on-the-machine measuring(OMM) system which can directly measure the two and three dimensional machined accuracy using a scanning probe in milling machine. Two algorithms, NC program based continuous path(CP) measurement and CAD data assisted point to point(PTP) measurement, are developed for three dimensional measurements, with consideration of the characteristics of the scanning probe. The algorithms are used to develop an auto measuring system. The delveloped system is compared with the CMM (Coordinate Measuring Machine) in terms of accuracy and repeatability. The OMM system is expected to realize measurement time reduction and hence result in high productivity.

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The Error Source Analysis of Measuring Data of OMM System (OMM 시스템의 측정오차 원인분석 및 대책)

  • 이상준;김선호;김옥현
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1997.04a
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    • pp.73-77
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    • 1997
  • This paper describes the analysis of measuring error of on the machine measuring(OMM) system which can directly measure the three dimensional machined free surface dimension using scanning probe on milling machine. 21 inch TV shadow mask mould was measured using PTP(point to point)measurement algorithm at pallet clamped and unclamped state on OMM system, and using coordinate measuring machine(CMM) one after another. The OMM system was evaluated probe error, stylus contact error, center shift error, repeatability and so on. Consequencely, the conclusion derived that elastic displacement of pallet had effect on measuring error mainly, and pallet design and setup method would be important.

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The Design of K-band Up converter with the Excellent IMD3 Performance (3차 혼변조 왜곡 특성이 우수한 K-band 상향변환기 설계)

  • 정인기;이영철
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.5
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    • pp.1120-1128
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    • 2004
  • In this paper, we has designed and implemented Up-converter for K-band with high IMD3 performance using balanced power amplifier. It is consisted of PA module and, Local Oscillator module with reject Filter, mixer module and If block, and Up-converter has a local loop path to decide whether it operate or not and has the sensing port to inspect output power level. According to the power budget of designed Up-converter, K-band balanced power amplifier was fabricated by commercial MMIC. Measurement results of up-converter show about 40dB Gain, PldB of 29dBm and OIP3 was 38.25dBm, that is good performance compared to power budgets. We has adjusted gate voltage of MMIC to control more than 30 dB gain. This up-converter was used in transceiver for PTP and PTMP, and applied to digital communication system that use QAM and QPSK modulation.