• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2005.05a
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• pp.855-860
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• 2005

For the accurate measurement of acoustic properties of a surface, efforts have been made to reduce errors caused by external disturbance. If the reflection coefficient is considered as a transfer function between reflected wave and incident wave, causality is required between them and the reflection coefficient should be of minimum phase. In this thesis, the minimum phase condition is applied to measure correct reflection coefficient. The reflection coefficient is approximated as a rational function in the Z domain by minimizing the sum square error. Then the minimum phase reflection coefficient is reconstructed using the distribution of poles and zeros of the reflection coefficient model. The incident wave, the reflected wave and the impulse response function of causality are recalculated from the minimum phase reflection coefficient for further applications.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.15 no.10 s.103
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• pp.1131-1136
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• 2005

For the accurate measurement of acoustic properties of a surface, efforts have been made to reduce errors caused by external disturbance. If the reflection coefficient is considered as a transfer function between reflected wane and incident wave, the causality is required between them and the reflection coefficient should be of minimum phase. In this thesis, the minimum phase condition is applied to measure correct reflection coefficient. The reflection coefficient is approximated as a rational function In the Z domain by minimizing the sum square error. Then the minimum phase reflection coefficient is reconstructed using the distribution of poles and zeros of the reflection coefficient model.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.276-279
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• 2003

The phase change upon reflection from target surfaces in white-light interferometer induces measurement errors when target surfaces are composed of dissimilar materials. We prove that this phase change on reflection considered of the polarization of the white-light causes the shift of both envelope peak position and fringe peak position of several tens of nanometer. In addition, we propose a new equation of white-light interference fringe pertinent to the polarization of source.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.9
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• pp.1-6
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• 1997

A transmission type phase shift attenuator has a poor reflection characteristics at an output port. And that is controlled by the current, its dynamic rnage decreases due to the current limitation. In this paper, to avoid such disadvantages, a reflection type low phase shift attenuator has been designed and measured. As a result, at a center frequency (1855MHz), the sreflection type low pahse shift attenuator has an attenuation of 30dB, within the limit of 3 phase shift and less than -17dB reflection characteristics at both input and output ports. And it demonstrates the peformance of the reflection type low phase shift attenuator is better than the transmission type phase shift attenuator with the same measurement specifications.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2003.12a
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• pp.117-121
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• 2003

In this paper, a micromachined low-loss and ultra wide band reflection-type phase shifter (RTPS) is proposed. The phase shifter shows a constant phase shift from 5 to 17 GHz and consists of two cascaded reflection-type phase shifter. Low-loss reflection termination consists of digital capacitive switches, and air-gap overlay CPW couplers are used in order to employ the low-loss 3 dB coupling. The fabricated phase shifter showed the 5 discrete states, $0^{\circ},{\;}22.5^{\circ},{\;}45^{\circ},{\;}67.5^{\circ},{\;}90^{\circ}$ respectively, the average insertion loss of 3.48 dB, and maximum rms phase error of ${\pm}1.80^{\circ}$ for the relative phase shift from $0^{\circ}{\;}to{\;}90^{\circ}$ over 5-17 GHz.

• Journal of Magnetics
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• v.6 no.2
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• pp.43-46
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• 2001

The reflection-amplitude approximation is used to calculate the interlayer exchange coupling in (001) Co/Cu/Co multilayers. The dependence of the phase factor of the reflection amplitude on the energy and wave vector is included. The contribution of each period is calculated and the results are compared with those from asymptotic behavior. It is shown that the energy and wave-vector dependence of the phase factor may affect the interlayer exchange coupling significantly.

• Korean Journal of Optics and Photonics
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• v.15 no.4
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• pp.331-336
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• 2004

The phase change due to the reflection from target surfaces in a white-light interferometer induces measurement errors when target surfaces are composed of dissimilar materials. We prove that this phase change on reflection as the polarization of the white-light changes causes a shift of both envelope peak position and fringe peak position of several tens of nanometers as the polarization of the white-light changes. In addition, we propose a new equation for white-light interference fringes depending on the polarization of the source.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.6
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• pp.641-646
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• 2004

We report the changes of the microwave reflection coefficients S$_{11}$ of copper(II)-phthalocyanine (CuPc) thin films by using a near-field microwave microscope(NSMM) in order to understand the phase transition of CuPc. For a NSMM system, a high-quality microstrip resonator coupled with a dielectric resonator was used. CuPc thin films were prepared on the pre-heated glass substrates using a thermal evaporation method. The reflection coefficients S$_{11}$ of CuPc thin films were changed by the dependence on the substrate pre-heating temperatures. By comparing reflection coefficient S$_{11}$ and crystal structures, we found the phase transition of CuPc thin films from $\alpha$-phase to $\beta$-phase at the substrate heating temperature 200 $^{\circ}C$./TEX>.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.942-944
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• 2009

Blue phase shows several different reflection colors from the randomly oriented domains and crystal direction. Also there are variations in the size of domains. The domain size is dependent on the temperature gradient. With smaller cooling rate of temperature, the domain size was increased compared with rapid cooling. With injection of light of specific wavelength, we find that the diffraction patterns were occurred around the light spot in the cell of blue phase. It was supposed to be from the matching of the phase retardation and domain size. However, actually the diffraction pattern is reflecting the lattice structure in double twist of the blue phase. The lattice constant from the radius of diffraction patterns shows very similar one from the reflection spectrum, which indicates the internal lattice constant in double twist of the blues phase.

• Proceedings of the Korean Institute of Navigation and Port Research Conference
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• 2006.10a
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• pp.95-104
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• 2006

A floating-type wave power pump is a device which sends air into water by using wave power. The floating-type wave power pump has the new configuration composed of a curved surface reflection board, a slope, and phase plates. As a result of a water-tank experiment it turned out that the floating-type wave power pump with a curved surface reflection board and a slope raised power and efficiency in the wide wavelength waves. The result of a marine experiment was also preferable. The floating-type wave power pump sends air into the sea by using wave power, so it can be used for the improvement of marine environment. In addition, the floating body constituted of a curved surface reflection board, a slope, and phase plates, is effective as a device to utilize the energy of a wave. Therefore, it can be widely used for a wave power generation, pumping up deep seawater.