• Journal of Information Processing Systems
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• 제13권5호
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• pp.1089-1102
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• 2017

In software systems, it has been observed that a fault is often caused by an interaction between a small number of input parameters. Even for moderately sized software systems, exhaustive testing is practically impossible to achieve. This is either due to time or cost constraints. Combinatorial (t-way) testing provides a technique to select a subset of exhaustive test cases covering all of the t-way interactions, without much of a loss to the fault detection capability. In this paper, an approach is proposed to generate 2-way (pairwise) test sets using genetic algorithms. The performance of the algorithm is improved by creating an initial solution using the overlap coefficient (a similarity matrix). Two mutation strategies have also been modified to improve their efficiency. Furthermore, the mutation operator is improved by using a combination of three mutation strategies. A comparative survey of the techniques to generate t-way test sets using genetic algorithms was also conducted. It has been shown experimentally that the proposed approach generates faster results by achieving higher percentage coverage in a fewer number of generations. Additionally, the size of the mixed covering arrays was reduced in one of the six benchmark problems examined.

• Communications for Statistical Applications and Methods
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• 제4권2호
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• pp.565-579
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• 1997

A robust test is proposed for the problem of testing the parallelism of several regression lines against ordered alternatives. The proposed test statistic is based on a linear combination of one-step pairwise GM-estimators. We compare the performance of the proposed test with that of the other tests through a Monte Carlo simulation. The results of the simulation study show that the proposed test has stable levels, good empirical powers in various circumstances, and particularly higher empirical powers under the presence of extreme outliers or leverage points.

• 한국정보과학회논문지:소프트웨어및응용
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• 제41권7호
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• pp.469-480
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• 2014

소프트웨어 제품라인은 제품들 간의 공통성 및 가변성을 전체 개발라이프사이클에 걸쳐 체계적으로 계획하고 재사용하여 생산성 향상, 비용절감, 시장적시성 향상을 꾀하는 소프트웨어 개발 패러다임이다. 소프트웨어 제품라인이 가져다 주는 이익을 최대화하기 위하여 시험은 도메인 공학과 어플리케이션 공학의 두 라이프사이클을 구성하는 프로세스들과 일관된 방식으로 통합되어야 하며, 더불어 시험 노력을 절감할 수 있어야 한다. 본 논문에서는 조합 시험 설계를 적용하여 제품라인 플랫폼을 시험할 시험항목을 생성함으로써 시험항목 개수를 상당히 줄이면서 동시에 재사용이 용이한 시험항목 생성을 지원하여 시험노력을 절감할 수 있는 조합 시험 설계를 이용한 제품라인 시험항목 생성 방법을 제안한다. 또한, 사례연구를 통하여 제안한 방법이 조합 설계를 이용하거나 그렇지 않은 기존의 다른 방법들 보다 효율적임을 보인다.